Resonant inelastic hard x-ray scattering with diced analyzer crystals and position-sensitive detectors

S. Huotari, F. Albergamo, Gy Vankó, R. Verbeni, G. Monaco

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Abstract

A novel design of a high-resolution spectrometer is proposed for emission spectroscopy and resonant inelastic hard x-ray scattering applications. The spectrometer is based on a Rowland circle geometry with a diced analyzer crystal and a position-sensitive detector. The individual flat crystallites of the diced analyzer introduce a well-defined linear position-energy relationship within the analyzer focus. This effect can be exploited to measure emission spectra with an unprecedented resolution. For demonstration, a spectrometer was constructed using a diced Si(553) analyzer working at the Cu K edge with an intrinsic resolution of 60 meV. With the proposed design, spectrometers operating at the K edges of 3d transition metals can have intrinsic resolutions below 100 meV even with analyzer crystals not working in Bragg-backscattering conditions.

Original languageEnglish
Article number053102
JournalReview of Scientific Instruments
Volume77
Issue number5
DOIs
Publication statusPublished - May 1 2006

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ASJC Scopus subject areas

  • Instrumentation

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