Refractive index depth profile and its relaxation in polydimethylsiloxane (PDMS) due to proton irradiation

S. Z. Szilasi, J. Budai, Z. Pápa, R. Huszánk, Z. Tóth, I. Rajta

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

In this work the refractive index depth profile, its relaxation and the absorption were investigated in 2MeV proton irradiated PDMS. The above parameters were determined by the spectroscopic ellipsometry technique. The refractive index depth profile follows roughly the shape of the Bragg curve for the penetrating protons. It is shown that the observed difference between the refractive index of the surface (dn = 0.01) and deeper regions (dn = 0.08) is high enough to accomplish waveguiding that is also demonstrated in this paper. This work serves as basis for the production of integrated optical components, e.g. waveguides, gratings or other optical devices, which are planned to be produced by ion irradiation in PDMS.

Original languageEnglish
Pages (from-to)370-374
Number of pages5
JournalMaterials Chemistry and Physics
Volume131
Issue number1-2
DOIs
Publication statusPublished - Dec 15 2011

Fingerprint

Proton irradiation
proton irradiation
Polydimethylsiloxane
Refractive index
refractivity
Protons
Bragg curve
profiles
Waveguide components
protons
Spectroscopic ellipsometry
Ion bombardment
Optical devices
ion irradiation
ellipsometry
gratings
waveguides
baysilon

Keywords

  • Ion implantation
  • Optical properties
  • Polymers
  • Radiation damage

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Refractive index depth profile and its relaxation in polydimethylsiloxane (PDMS) due to proton irradiation. / Szilasi, S. Z.; Budai, J.; Pápa, Z.; Huszánk, R.; Tóth, Z.; Rajta, I.

In: Materials Chemistry and Physics, Vol. 131, No. 1-2, 15.12.2011, p. 370-374.

Research output: Contribution to journalArticle

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