Recent developments in synchrotron Mössbauer reflectometry

L. Deák, L. Bottyán, M. Major, D. L. Nagy, H. Spiering, E. Szilágyi, F. Tanczikó

Research output: Contribution to journalArticle

3 Citations (Scopus)


Synchrotron Mössbauer Reflectometry (SMR), the grazing incidence nuclear resonant scattering of synchrotron radiation, can be applied to perform depth-selective phase analysis and to determine the isotopic and magnetic structure of thin films and multilayers. Principles and methodological aspects of SMR are briefly reviewed. Off-specular SMR provides information from the lateral structure of multilayers. In anti-ferromagneticly coupled systems the size of magnetic domains can be measured.

Original languageEnglish
Pages (from-to)45-52
Number of pages8
JournalHyperfine Interactions
Issue number1-4
Publication statusPublished - Dec 1 2002



  • Anisotropic optics
  • Antiferromagnetic domains
  • Magnetic multilayers
  • Mössbauer reflectometry
  • Off-specular scattering

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Nuclear and High Energy Physics
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry

Cite this

Deák, L., Bottyán, L., Major, M., Nagy, D. L., Spiering, H., Szilágyi, E., & Tanczikó, F. (2002). Recent developments in synchrotron Mössbauer reflectometry. Hyperfine Interactions, 144-145(1-4), 45-52.