Real-time monitoring of electrochemical migration during environmental tests

Balint Medgyes, Richard Berenyi, Laszlo Jakab, Gabor Harsanyi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

More and more reliability and quality problems of electrical assemblies have to be solved due to the trend of miniaturization and the even higher level of integration. In some cases these failures can lead to catastrophic failure. The phenomenon of electrochemical migration is one ofthe most dangerous failure mechanism which usually results in short resistive circuits. In this paper electrochemical migration (ECM) failure phenomena is be investigated which was real-time monitored by the measurements ofelectrical parameters ofconductor patterns with immersion Ag and immersion Agfinish coated with Sn60Pb on Printed Wiring Boards (PWB.) Highly Accelerated Stress Test (HAST) and Thermal Humidity Bias (THB) tests were carried out and Mean Time To Failure (MTTF) comparison was investigated between immersion Ag and immersion Ag coated with Sn60Pb. Only preliminary investigations were presented in order to determine the steps of the full ECMprocess on different substrates, surface finishes, solder alloys under various climatic conditions. The key findings were that the MTTFs during HAST tests were significantly shorter than in case of THB tests.

Original languageEnglish
Title of host publicationISSE 2009
Subtitle of host publication32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings
DOIs
Publication statusPublished - Nov 20 2009
EventISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Brno, Czech Republic
Duration: May 13 2009May 17 2009

Publication series

NameISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings

Other

OtherISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics
CountryCzech Republic
CityBrno
Period5/13/095/17/09

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ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Medgyes, B., Berenyi, R., Jakab, L., & Harsanyi, G. (2009). Real-time monitoring of electrochemical migration during environmental tests. In ISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings [5207046] (ISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings). https://doi.org/10.1109/ISSE.2009.5207046