Raman and x-ray diffraction studies of nanometric Sn2P2S6 crystals

A. V. Gomonnai, Yu M. Azhniuk, Yu M. Vysochanskii, A. A. Kikineshi, M. Kis-Varga, L. Daroczy, I. P. Prits, I. M. Voynarovych

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11 Citations (Scopus)

Abstract

Nanometric Sn2P2S6 crystalline powders and ceramics are studied by x-ray diffraction and Raman spectroscopy. The average crystalline size is estimated from TEM and x-ray data. The observed features in the Raman spectra are discussed in view of confinement-related selection rules relaxation, surface phonon modes and possible partial substitution of sulfur by oxygen at the nanometric powder surface.

Original languageEnglish
Pages (from-to)6381-6393
Number of pages13
JournalJournal of Physics Condensed Matter
Volume15
Issue number37
DOIs
Publication statusPublished - Sep 24 2003

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

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    Gomonnai, A. V., Azhniuk, Y. M., Vysochanskii, Y. M., Kikineshi, A. A., Kis-Varga, M., Daroczy, L., Prits, I. P., & Voynarovych, I. M. (2003). Raman and x-ray diffraction studies of nanometric Sn2P2S6 crystals. Journal of Physics Condensed Matter, 15(37), 6381-6393. https://doi.org/10.1088/0953-8984/15/37/006