Raman and x-ray diffraction studies of nanometric Sn2P2S6 crystals

A. V. Gomonnai, Yu M. Azhniuk, Yu M. Vysochanskii, S. Kökényesi, M. Kis-Varga, L. Daróczi, I. P. Prits, I. M. Voynarovych

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Nanometric Sn2P2S6 crystalline powders and ceramics are studied by x-ray diffraction and Raman spectroscopy. The average crystalline size is estimated from TEM and x-ray data. The observed features in the Raman spectra are discussed in view of confinement-related selection rules relaxation, surface phonon modes and possible partial substitution of sulfur by oxygen at the nanometric powder surface.

Original languageEnglish
Pages (from-to)6381-6393
Number of pages13
JournalJournal of Physics Condensed Matter
Volume15
Issue number37
DOIs
Publication statusPublished - Sep 24 2003

Fingerprint

Powders
x ray diffraction
Diffraction
Surface relaxation
Crystalline materials
X rays
Crystals
Sulfur
crystals
Raman spectroscopy
Raman scattering
Substitution reactions
sulfur
ceramics
substitutes
Raman spectra
Oxygen
Transmission electron microscopy
transmission electron microscopy
oxygen

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Gomonnai, A. V., Azhniuk, Y. M., Vysochanskii, Y. M., Kökényesi, S., Kis-Varga, M., Daróczi, L., ... Voynarovych, I. M. (2003). Raman and x-ray diffraction studies of nanometric Sn2P2S6 crystals. Journal of Physics Condensed Matter, 15(37), 6381-6393. https://doi.org/10.1088/0953-8984/15/37/006

Raman and x-ray diffraction studies of nanometric Sn2P2S6 crystals. / Gomonnai, A. V.; Azhniuk, Yu M.; Vysochanskii, Yu M.; Kökényesi, S.; Kis-Varga, M.; Daróczi, L.; Prits, I. P.; Voynarovych, I. M.

In: Journal of Physics Condensed Matter, Vol. 15, No. 37, 24.09.2003, p. 6381-6393.

Research output: Contribution to journalArticle

Gomonnai, AV, Azhniuk, YM, Vysochanskii, YM, Kökényesi, S, Kis-Varga, M, Daróczi, L, Prits, IP & Voynarovych, IM 2003, 'Raman and x-ray diffraction studies of nanometric Sn2P2S6 crystals', Journal of Physics Condensed Matter, vol. 15, no. 37, pp. 6381-6393. https://doi.org/10.1088/0953-8984/15/37/006
Gomonnai, A. V. ; Azhniuk, Yu M. ; Vysochanskii, Yu M. ; Kökényesi, S. ; Kis-Varga, M. ; Daróczi, L. ; Prits, I. P. ; Voynarovych, I. M. / Raman and x-ray diffraction studies of nanometric Sn2P2S6 crystals. In: Journal of Physics Condensed Matter. 2003 ; Vol. 15, No. 37. pp. 6381-6393.
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