Radiation tolerance tests of components for the FERMI microchip module

J. Molnár, A. Fenyvesi, G. Dajkó, J. Végh, A. Kerek, D. Novák

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A project has been in progress to provide information on radiation hardness properties of components to be used in the Front End Readout MIcrosystem (FERMI) collaboration. Neutron activation studies as well as neutron and γ radiation tolerance tests have been carried out on digital circuit components, prepared with different (partly radiation hardened) technologies, using 3.7 MeV average energy neutron and 60Co γ radiation. The test board and the irradiation conditions as well as the data acquisition and evaluation program are described.

Original languageEnglish
Pages (from-to)536-546
Number of pages11
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume143
Issue number4
DOIs
Publication statusPublished - Oct 1 1998

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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