Quantification of nanocrystallization by means of X-ray line profile analysis

M. J. Zehetbauer, E. Schafler, T. Ungár

Research output: Contribution to journalArticle

Abstract

In crystalline materials the structural scale reaches submicron or even nanometer sizes when plastic deformation is sustained up to very high strains, low deformation temperatures and/or extended hydrostatic pressure. In order to find out the mechanisms of crystal fragmentation, X-ray Line Profile Analysis (XPA) can provide a number of important parameters which are not (or only scarcely) available by other methods such as TEM and residual electrical resistivity. These are the density, arrangement and type of dislocations, and the internal stresses which all can be determined even in case of very large strains and high contents of alloying atoms. Extending XPA to profiles at high order diffraction (Multi Reflection Profile Analysis, MXPA) it is possible to carefully separate strain broadening from size broadening. This is particularly important when the nanomaterials reveal grain sizes smaller than 100 nm, when the size broadening gets similarly high than strain broadening from plastic deformation. In dislocated metals, the dislocation contrast has to be taken into account for a correct evaluation of grain size which reduces to the coherently scattering domain size in case of nanocrystallization due to plastic deformation, namely SPD. When using highly intense Synchrotron radiation, a maximum in spatial and even time resolution is reached enabling in-situ measurements during deformation of the parameters quoted.

Original languageEnglish
Pages (from-to)515-533
Number of pages19
JournalArchives of Metallurgy and Materials
Volume50
Issue number2
Publication statusPublished - 2005

Fingerprint

Nanocrystallization
X rays
Plastic deformation
Hydrostatic pressure
Synchrotron radiation
Alloying
Nanostructured materials
Residual stresses
Diffraction
Metals
Scattering
Crystalline materials
Transmission electron microscopy
Atoms
Crystals
Temperature

Keywords

  • Multi Reflection Profile Analysis
  • Nanocrystallization
  • Severe Plastic Deformation
  • Size and Strain Broadening
  • Synchrotron radiation

ASJC Scopus subject areas

  • Metals and Alloys

Cite this

Quantification of nanocrystallization by means of X-ray line profile analysis. / Zehetbauer, M. J.; Schafler, E.; Ungár, T.

In: Archives of Metallurgy and Materials, Vol. 50, No. 2, 2005, p. 515-533.

Research output: Contribution to journalArticle

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