Pulse plated amorphous Fe-P thin layers for high frequency magnetic applications

A. Mikó, M. Takács, M. Lakatos-Varsányi, L. K. Varga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Amorphous and partly nanocrystalline amorphous iron-phosphorus (Fe-P) layers have been deposited by pulse electrochemical technique. X-ray Diffraction (XRD) and Transmission Electron Microscopy (TEM) have been used to characterize the structure in the layers. Depending on the pulse parameters, the structure of Fe-P layers changed from mostly amorphous to partly nanocrystalline amorphous. The magnetic coercivity and the frequency limit of the samples are discussed in terms of the structure of the Fe-P layers. The frequency limit as determined from the permeability spectra is above 10 MHz, which makes these layers suitable for high frequency inductive element applications.

Original languageEnglish
Title of host publicationMaterials Science, Testing and Informatics III - Proceedings of the 5th Hungarian Conference on Materials Science, Testing and Informatics
Pages231-238
Number of pages8
Publication statusPublished - Dec 1 2007
Event5th Hungarian Conference on Materials Science, Testing and lnformatics - Balatonfured, Hungary
Duration: Oct 9 2005Oct 11 2005

Publication series

NameMaterials Science Forum
Volume537-538
ISSN (Print)0255-5476

Other

Other5th Hungarian Conference on Materials Science, Testing and lnformatics
CountryHungary
CityBalatonfured
Period10/9/0510/11/05

Keywords

  • Fe-P thin layers
  • Initial permeability
  • Magnetic hysteresis loops
  • Pulse electrodeposition
  • XRD

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Mikó, A., Takács, M., Lakatos-Varsányi, M., & Varga, L. K. (2007). Pulse plated amorphous Fe-P thin layers for high frequency magnetic applications. In Materials Science, Testing and Informatics III - Proceedings of the 5th Hungarian Conference on Materials Science, Testing and Informatics (pp. 231-238). (Materials Science Forum; Vol. 537-538).