Probe beam deflection study of the transport of ions during the redox reaction of indium-hexacyanoferrate films

E. Csahók, E. Vieil, G. Inzelt

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Abstract

The probe beam deflection technique was employed to follow the ion transport and ion exchange processes taking place in the course of redox transformations of indium-hexacyanoferrate surface layers. In accordance with the results of quartz crystal microbalance studies it was established that the principal charge compensating ions are cations. The data analysis by the help of a convolution method attested that the contribution of anions to the charge neutralization inside the film below 0.9 V versus SCE is less than 7%, if any at all.

Original languageEnglish
Pages (from-to)251-255
Number of pages5
JournalJournal of Electroanalytical Chemistry
Volume457
Issue number1-2
DOIs
Publication statusPublished - Oct 15 1998

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Keywords

  • Indium-hexacyanoferrate
  • Ion exchange
  • Probe beam deflection

ASJC Scopus subject areas

  • Analytical Chemistry
  • Chemical Engineering(all)
  • Electrochemistry

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