Probe beam deflection study of the transport of ions during the redox reaction of indium-hexacyanoferrate films

E. Csahók, E. Vieil, G. Inzelt

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

The probe beam deflection technique was employed to follow the ion transport and ion exchange processes taking place in the course of redox transformations of indium-hexacyanoferrate surface layers. In accordance with the results of quartz crystal microbalance studies it was established that the principal charge compensating ions are cations. The data analysis by the help of a convolution method attested that the contribution of anions to the charge neutralization inside the film below 0.9 V versus SCE is less than 7%, if any at all.

Original languageEnglish
Pages (from-to)251-255
Number of pages5
JournalJournal of Electroanalytical Chemistry
Volume457
Issue number1-2
Publication statusPublished - Oct 15 1998

Fingerprint

Indium
Redox reactions
Ions
Quartz crystal microbalances
Convolution
Anions
Cations
Ion exchange
Negative ions
Positive ions
ferrocyn
Oxidation-Reduction

Keywords

  • Indium-hexacyanoferrate
  • Ion exchange
  • Probe beam deflection

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Analytical Chemistry
  • Electrochemistry

Cite this

Probe beam deflection study of the transport of ions during the redox reaction of indium-hexacyanoferrate films. / Csahók, E.; Vieil, E.; Inzelt, G.

In: Journal of Electroanalytical Chemistry, Vol. 457, No. 1-2, 15.10.1998, p. 251-255.

Research output: Contribution to journalArticle

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