Preparation and properties of langasite and YAG Amorphous films

M. Popescu, F. Sava, A. Lorinczi, M. Stegarescu, S. Georgescu, I. N. Mihailescu, G. Socol, D. Stanoi, L. Daroczi, A. Kokenyesi, M. Leonovici, D. Wagner

Research output: Contribution to journalArticle


Amorphous thin films of langasite and YAG have been prepared from crystals targets by pulsed laser deposition, at room temperature, in vacuum, on silicon wafers. Bulges of micrometer size are formed on the film surface. Larger size bulges (10-50 micrometers in diameter) are characteristic to the annealed langasite films. Annealing at high temperatures leads to the crystallization of the films. The annealed langasite films (850°C) are polycrystalline and partially oriented with the plane (001) parallel to the surface of the silicon wafer. The bulges break easily in the heat treated films. Their empty structure was remarked on the electron microscope images. The YAG films annealed at 1100°C shows a crystalline YAG phase depleted in Y and traces of Y 2O 3. An interesting feature is the presence of silver particles spread along the macrodefects (fracture lines) of the film.

Original languageEnglish
Pages (from-to)963-966
Number of pages4
JournalJournal of Optoelectronics and Advanced Materials
Issue number2
Publication statusPublished - Apr 1 2005


  • Amorphous
  • Crystallization
  • Langasite
  • Pulsed laser deposition
  • X-ray diffraction
  • YAG

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Popescu, M., Sava, F., Lorinczi, A., Stegarescu, M., Georgescu, S., Mihailescu, I. N., Socol, G., Stanoi, D., Daroczi, L., Kokenyesi, A., Leonovici, M., & Wagner, D. (2005). Preparation and properties of langasite and YAG Amorphous films. Journal of Optoelectronics and Advanced Materials, 7(2), 963-966.