Precision X-ray spectroscopy at the NIST electron-beam ion trap: Resolution of major systematic error

C. T. Chantier, D. Paterson, L. T. Hudson, F. G. Serpa, J. D. Gillaspy, E. Takács

Research output: Chapter in Book/Report/Conference proceedingChapter

14 Citations (Scopus)

Abstract

Some of the most critical tests of the QED Lamb shifts are currently being pursued in the X-ray regime by investigating the core levels of medium Z atoms such as vanadium. The current approach to the measurement of the Lamb shift in such a system is outlined. We present major progress in understanding and reducing the systematic errors within our system. The error budget has been reduced to a level where critical tests of QED can be performed. Recent observations of Lyman a in hydrogenic vanadium at the NIST Electron-Beam Ion Trap are presented.

Original languageEnglish
Title of host publicationPhysica Scripta T
Pages440-442
Number of pages3
Volume80
EditionB
Publication statusPublished - 1999

Fingerprint

systematic errors
vanadium
electron beams
shift
budgets
spectroscopy
x rays
atoms

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Chantier, C. T., Paterson, D., Hudson, L. T., Serpa, F. G., Gillaspy, J. D., & Takács, E. (1999). Precision X-ray spectroscopy at the NIST electron-beam ion trap: Resolution of major systematic error. In Physica Scripta T (B ed., Vol. 80, pp. 440-442)

Precision X-ray spectroscopy at the NIST electron-beam ion trap : Resolution of major systematic error. / Chantier, C. T.; Paterson, D.; Hudson, L. T.; Serpa, F. G.; Gillaspy, J. D.; Takács, E.

Physica Scripta T. Vol. 80 B. ed. 1999. p. 440-442.

Research output: Chapter in Book/Report/Conference proceedingChapter

Chantier, CT, Paterson, D, Hudson, LT, Serpa, FG, Gillaspy, JD & Takács, E 1999, Precision X-ray spectroscopy at the NIST electron-beam ion trap: Resolution of major systematic error. in Physica Scripta T. B edn, vol. 80, pp. 440-442.
Chantier CT, Paterson D, Hudson LT, Serpa FG, Gillaspy JD, Takács E. Precision X-ray spectroscopy at the NIST electron-beam ion trap: Resolution of major systematic error. In Physica Scripta T. B ed. Vol. 80. 1999. p. 440-442
Chantier, C. T. ; Paterson, D. ; Hudson, L. T. ; Serpa, F. G. ; Gillaspy, J. D. ; Takács, E. / Precision X-ray spectroscopy at the NIST electron-beam ion trap : Resolution of major systematic error. Physica Scripta T. Vol. 80 B. ed. 1999. pp. 440-442
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