Precision structural diagnostics of layered superconductor/ferromagnet nanosystems V/Fe by reflectometry and diffuse scattering of synchrotron radiation

A. M. Nikitin, M. M. Borisov, E. Kh Mukhamedzhanov, M. V. Kovalchuk, S. Sajti, F. Tancziko, L. Deak, L. Bottyan, Yu N. Khaydukov, V. L. Aksenov

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Abstract

Layered superconducting ferromagnetic nanosystems Cu(32 nm)/V(40-80 nm)/Fe(0.5-4 nm)/MgO(001) have been investigated by reflectometry and the diffuse scattering of synchrotron radiation. The data obtained make it possible to determine the important characteristics of samples such as the layer thickness and the rms heights and lateral correlation lengths of roughness at the interfaces.

Original languageEnglish
Pages (from-to)858-865
Number of pages8
JournalCrystallography Reports
Volume56
Issue number5
DOIs
Publication statusPublished - Sep 1 2011

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ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Nikitin, A. M., Borisov, M. M., Mukhamedzhanov, E. K., Kovalchuk, M. V., Sajti, S., Tancziko, F., Deak, L., Bottyan, L., Khaydukov, Y. N., & Aksenov, V. L. (2011). Precision structural diagnostics of layered superconductor/ferromagnet nanosystems V/Fe by reflectometry and diffuse scattering of synchrotron radiation. Crystallography Reports, 56(5), 858-865. https://doi.org/10.1134/S106377451105021X