Possible acception criteria for structure functions

Albin Szalai, Vladimir Székely

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

This paper deals with the verification of thermal transient evaluation implementations. This subject is relevant because e.g. the upcoming standard will describe the thermal transient measurement as a standard method to estimate the junction-to-case thermal resistance [1,2], thus anybody can create their own implementation of the evaluation method. We have to have a method to verify these implementations. For this reason we examined the result of the NID (Network Identification by Deconvolution) method from different aspects. For these examinations we defined a multilayer structure as a reference structure and we analytically expressed the unit-step response and the cumulative structure function of this structure. Using the unit-step response as an input data set for the implementation in question we got an approximation of the structure function. Analysing this and the reference RC network we could define a practical maximum tolerance for the deviation between the analytical and the calculated functions.

Original languageEnglish
Pages (from-to)164-168
Number of pages5
JournalMicroelectronics Journal
Volume43
Issue number2
DOIs
Publication statusPublished - Feb 1 2012

Keywords

  • Fault tolerance
  • Lumped parameter networks
  • Reference circuits
  • Standards
  • Thermal resistance
  • Time-domain analysis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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