Porous silicon multilayer stack for sensitive refractive index determination of pure solvents

J. Volk, T. Le Grand, I. Bársony, J. Gombkötö, J. J. Ramsden

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

The use of a device consisting of alternating layers of high and low refractive index porous silicon, arranged as a Fabry-Perot cavity, as an inexpensive and miniature refractometer is investigated. The position of the reflectance minimum depends on the pore structure as well as on the material filling the pores. We show that the presence of an interfacial layer at the internal silicon surfaces plays a crucial role in determining the quantitative relationship between the position of the reflectance minimum (i.e. the optical output of the device) and the refractive index of the medium filling the pores (i.e. the material whose presence is being sensed). The intended application of the device is in chemical and possibly biological sensing rather than in the accurate absolute determination of refractive indices.

Original languageEnglish
Pages (from-to)1313-1317
Number of pages5
JournalJournal of Physics D: Applied Physics
Volume38
Issue number8
DOIs
Publication statusPublished - Apr 21 2005

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Porous silicon
porous silicon
Refractive index
Multilayers
refractivity
porosity
Refractometers
reflectance
refractometers
Silicon
Pore structure
cavities
output
silicon

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Porous silicon multilayer stack for sensitive refractive index determination of pure solvents. / Volk, J.; Le Grand, T.; Bársony, I.; Gombkötö, J.; Ramsden, J. J.

In: Journal of Physics D: Applied Physics, Vol. 38, No. 8, 21.04.2005, p. 1313-1317.

Research output: Contribution to journalArticle

Volk, J. ; Le Grand, T. ; Bársony, I. ; Gombkötö, J. ; Ramsden, J. J. / Porous silicon multilayer stack for sensitive refractive index determination of pure solvents. In: Journal of Physics D: Applied Physics. 2005 ; Vol. 38, No. 8. pp. 1313-1317.
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