Polarized resonant inelastic X-ray scattering as an ultrafine probe of excited states of La2CuO4

Abhay Shukla, Matteo Calandra, Munetaka Taguchi, Akio Kotani, G. Vankó, S. W. Cheong

Research output: Contribution to journalArticle

37 Citations (Scopus)

Abstract

X-ray absorption is the standard method to probe the unoccupied density of states at a given edge. Here we show that polarized resonant inelastic x-ray scattering in La2CuO4 at the Cu K edge is extremely sensitive to the environment of the Cu atom and the fine structure in the Cu 4p density of states. Combined ab initio and many-body cluster calculations, used for the first time in such a context, show remarkable agreement with experiment. In particular, we identify a nonlocal effect, namely, a transition to off-site Cu 3d states.

Original languageEnglish
Article number077006
JournalPhysical Review Letters
Volume96
Issue number7
DOIs
Publication statusPublished - 2006

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probes
x ray scattering
scattering
excitation
inelastic scattering
x rays
fine structure
atoms

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Polarized resonant inelastic X-ray scattering as an ultrafine probe of excited states of La2CuO4. / Shukla, Abhay; Calandra, Matteo; Taguchi, Munetaka; Kotani, Akio; Vankó, G.; Cheong, S. W.

In: Physical Review Letters, Vol. 96, No. 7, 077006, 2006.

Research output: Contribution to journalArticle

Shukla, Abhay ; Calandra, Matteo ; Taguchi, Munetaka ; Kotani, Akio ; Vankó, G. ; Cheong, S. W. / Polarized resonant inelastic X-ray scattering as an ultrafine probe of excited states of La2CuO4. In: Physical Review Letters. 2006 ; Vol. 96, No. 7.
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