Planar defects, dislocations, and coherently scattering-size in GdBa 2Cu3O7-x high-Tc thin films determined by high resolution X-ray diffraction

Gábor Csiszár, Xiao Fen Li, Gyula Zilahi, Levente Balogh, Tamás Ungár

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Abstract

The frequency of planar defects, the average dislocation densities, and coherent domain size in epitaxial GdBa2Cu3O7-x high Tc thin films, with altering CuO2 and CuO planes, are measured by fitting full widths at half maximum values of 00l type reflections using a model function based on intensity distribution configurations in reciprocal space. The reduction of the dislocation density during oxygenation seems to be an unavoidable condition to obtain superconductivity in GdBa 2Cu3O7-x thin films.

Original languageEnglish
Article number033903
JournalJournal of Applied Physics
Volume113
Issue number3
DOIs
Publication statusPublished - Jan 21 2013

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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