PIXEKLM-TPI - A software package for quantitative elemental imaging with nuclear microprobe

Research output: Contribution to journalArticle

29 Citations (Scopus)

Abstract

An off-line true elemental mapping procedure has been implemented at the Debrecen scanning nuclear microprobe facility for particle induced X-ray emission (μPIXE) measurements. The principles of the dynamic analysis model introduced by Ryan and Jamieson were adapted and extended towards the direction of the analysis of any thickness and large area samples. For the calculations the PIXEKLM program package was upgraded and a new windows-platform program (True PIXE Imaging) developed. Elemental concentration maps can be created from Oxford-type list mode files for major and trace elements from carbon to uranium.

Original languageEnglish
Pages (from-to)156-161
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume231
Issue number1-4
DOIs
Publication statusPublished - Apr 2005

Fingerprint

Software packages
computer programs
Imaging techniques
X rays
Uranium
Trace Elements
Trace elements
files
trace elements
lists
Dynamic analysis
uranium
x rays
Carbon
platforms
Scanning
scanning
carbon
Direction compound

Keywords

  • Micro-PIXE
  • PIXEKLM-TPI program
  • True elemental mapping

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

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abstract = "An off-line true elemental mapping procedure has been implemented at the Debrecen scanning nuclear microprobe facility for particle induced X-ray emission (μPIXE) measurements. The principles of the dynamic analysis model introduced by Ryan and Jamieson were adapted and extended towards the direction of the analysis of any thickness and large area samples. For the calculations the PIXEKLM program package was upgraded and a new windows-platform program (True PIXE Imaging) developed. Elemental concentration maps can be created from Oxford-type list mode files for major and trace elements from carbon to uranium.",
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AB - An off-line true elemental mapping procedure has been implemented at the Debrecen scanning nuclear microprobe facility for particle induced X-ray emission (μPIXE) measurements. The principles of the dynamic analysis model introduced by Ryan and Jamieson were adapted and extended towards the direction of the analysis of any thickness and large area samples. For the calculations the PIXEKLM program package was upgraded and a new windows-platform program (True PIXE Imaging) developed. Elemental concentration maps can be created from Oxford-type list mode files for major and trace elements from carbon to uranium.

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