Picosecond transient reflectance of thin metal films

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Abstract

Picosecond transient reflectance (PTR) of metals is shown to depend strongly on temperature and strain coefficients of the complex dielectric constant. For short times the PTR is influenced by the strains, and byproducts of the heating process. Thermal transport properties may be determined after the strain edge moves farther than several optical penetration depths. Methods are suggested for the determination of temperature and strain coefficients of the complex dielectric constant as well as for the extraction of the thermal transport parameters of thin films.

Original languageEnglish
Pages (from-to)2968-2972
Number of pages5
JournalJournal of Applied Physics
Volume66
Issue number7
DOIs
Publication statusPublished - Dec 1 1989

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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