Photoluminescence of deep levels in (CdZn) Te-correlation with diffusion length measurement

J. Franc, P. Hlídek, H. Sitter, E. Belas, A. Tóth, L. Turjanska, P. Hoschl

Research output: Contribution to journalArticle

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Abstract

Photoluminescence of deep levels near mid-gap in P-(Cd1-xZnx)Te (x≈0.03-0.05) grown by the vertical gradient freezing method was investigated. Correlation with recombination properties manifested by temperature dependence of diffusion length of minority electrons and the corresponding mobility-lifetime product was studied. Low-temperature photoluminescence (PL) in the spectral range 0.68-1.3 eV and a temperature dependence of diffusion length of minority electrons (DL) measured by EBIC in the temperature range 60-300 K on both as-grown and annealed samples (800 °C and 900 °C) were investigated. We observed, that while as-grown samples exhibited a steep increase in DL with decreasing temperature in the temperature range 60-140 K, annealing and subsequent quenching resulted in a significant decrease of DL at these temperatures. Photoluminescence band with a peak at approx. 0.84 eV in annealed samples with increased recombination and therefore low DL was observed, while no such peak was detected in the as-grown samples with high DL. Luminescence in the ≈0.8 eV band is usually attributed to a VCd related defect which is supposed to act as a recombination centre. It can be concluded, that a correlation between effects of increased recombination manifested by decreased values of DL at temperatures 60-140 K and detection of the≈0.8 eV PL band was observed. Reduction of the mobility-lifetime product by increased recombination in (CdZn)Te single crystals is therefore probably connected with a presence of a VCd-related defect.

Original languageEnglish
Pages (from-to)883-886
Number of pages4
JournalPhysica B: Condensed Matter
Volume273-274
DOIs
Publication statusPublished - Dec 15 1999

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diffusion length
Photoluminescence
photoluminescence
minorities
Temperature
temperature
life (durability)
temperature dependence
defects
products
freezing
electrons
Defects
quenching
Electrons
luminescence
gradients
Freezing
annealing
single crystals

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Photoluminescence of deep levels in (CdZn) Te-correlation with diffusion length measurement. / Franc, J.; Hlídek, P.; Sitter, H.; Belas, E.; Tóth, A.; Turjanska, L.; Hoschl, P.

In: Physica B: Condensed Matter, Vol. 273-274, 15.12.1999, p. 883-886.

Research output: Contribution to journalArticle

Franc, J. ; Hlídek, P. ; Sitter, H. ; Belas, E. ; Tóth, A. ; Turjanska, L. ; Hoschl, P. / Photoluminescence of deep levels in (CdZn) Te-correlation with diffusion length measurement. In: Physica B: Condensed Matter. 1999 ; Vol. 273-274. pp. 883-886.
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