Photoemission spectra of ion implanted amorphous Si and Fe 84 B 16 metal glass

G. Pető, J. Kanski

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Abstract

Ultraviolet photoemission spectra of Si and Fe 84 B 16 were measured in amorphous and crystalline states at 10.2 eV photon energy. The surface compositions were determined by Auger electron spectroscopy. The samples were prepared by ion implantation, evaporation and by splat-cooling. The photoelectron spectra of amorphous phases are found to be different from those of the crystalline for both materials and all preparation methods. The UPS of amorphous Si and Fe 84 B 16 metal glass have some common characteristics.

Original languageEnglish
Pages (from-to)377-381
Number of pages5
JournalSolid State Communications
Volume38
Issue number5
DOIs
Publication statusPublished - May 1981

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ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

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