Parameterization of nonlinearity for efficient estimation in ADC testing

Tamás Virosztek, I. Kollár

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In Maximum Likelihood (ML) estimation of ADC parameters, the estimation of static transfer characteristic has key importance. However, the description of static transfer characteristic demands to handle numerous values. Without parameterization, the non-linearity of an N-bit converter can be described using 2N - 1 integral nonlinearity (INL) values. Nevertheless for real ADCs the INL values are not independent, the information regarding the nonlinearity can be compressed. This paper enumerates multiple methods to measure and approximate the static transfer characteristic of the ADCs, and evaluates their efficiency. The results are expressed paying attention to the number of parameters and using standard measures for the approximation error (e.g. the l norm of the error vector).

Original languageEnglish
Title of host publication21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing
PublisherIMEKO-International Measurement Federation Secretariat
Pages77-82
Number of pages6
Publication statusPublished - 2016
Event21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing - Budapest, Hungary
Duration: Sep 7 2016Sep 9 2016

Other

Other21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing
CountryHungary
CityBudapest
Period9/7/169/9/16

Fingerprint

Efficient Estimation
Parameterization
Nonlinearity
Testing
Maximum likelihood estimation
Approximation Error
Maximum Likelihood Estimation
Converter
Norm
Evaluate

Keywords

  • ADC testing
  • Estimation
  • INL
  • Maximum likelihood
  • Parameterization

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Modelling and Simulation

Cite this

Virosztek, T., & Kollár, I. (2016). Parameterization of nonlinearity for efficient estimation in ADC testing. In 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing (pp. 77-82). IMEKO-International Measurement Federation Secretariat.

Parameterization of nonlinearity for efficient estimation in ADC testing. / Virosztek, Tamás; Kollár, I.

21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing. IMEKO-International Measurement Federation Secretariat, 2016. p. 77-82.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Virosztek, T & Kollár, I 2016, Parameterization of nonlinearity for efficient estimation in ADC testing. in 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing. IMEKO-International Measurement Federation Secretariat, pp. 77-82, 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing, Budapest, Hungary, 9/7/16.
Virosztek T, Kollár I. Parameterization of nonlinearity for efficient estimation in ADC testing. In 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing. IMEKO-International Measurement Federation Secretariat. 2016. p. 77-82
Virosztek, Tamás ; Kollár, I. / Parameterization of nonlinearity for efficient estimation in ADC testing. 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing. IMEKO-International Measurement Federation Secretariat, 2016. pp. 77-82
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