Parallel-processing single-beam Fourier-imaging thermal-wave microscopes: Line-heating systems

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Thermal-wave microscopes are generally restricted in speed by their long integration times and the point-by-point scanning mode. In this paper the properties of Fourier-imaging line-heating thermal-wave microscopes are considered. These new microscopes can overcome the speed limit by offering a parallel-processing mode for points placed along a narrow line, determined by the resolution of the optical system. The method allows single-beam arrangement, i.e., the reflected part of the heating beam is the means for detection. In particular, the dark-field and the phase-contrast techniques are studied.

Original languageEnglish
Pages (from-to)4342-4346
Number of pages5
JournalJournal of Applied Physics
Volume64
Issue number9
DOIs
Publication statusPublished - 1988

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microscopes
heating
phase contrast
scanning

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Parallel-processing single-beam Fourier-imaging thermal-wave microscopes : Line-heating systems. / Lőrincz, A.

In: Journal of Applied Physics, Vol. 64, No. 9, 1988, p. 4342-4346.

Research output: Contribution to journalArticle

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