Oxide layers of Zr-1% Nb under PWR primary circuit conditions

Gabor Nagy, Z. Kerner, G. Battistig, Anna Pintér-Csordás, J. Balog, T. Pajkossy

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Oxide layers were grown on Zr-1% Nb under conditions simulating those in VVER-type pressurised water reactors (PWRs), viz. in borate solutions in an autoclave at 290°C. The layers were characterised by various methods: their respective thickness values were determined by weight gain measurements, Rutherford backscattering (RBS), nuclear reaction analysis (NRA) and scanning electron microscopy (SEM); the electrical properties were tested by electrochemical impedance spectroscopy. The results show that the oxide layer on Zr-1% Nb is homogeneous and somewhat thicker than that on Zircaloy-4.

Original languageEnglish
Pages (from-to)62-68
Number of pages7
JournalJournal of Nuclear Materials
Volume297
Issue number1
DOIs
Publication statusPublished - Jul 2001

Fingerprint

pressurized water reactors
Pressurized water reactors
Oxides
Gain measurement
Borates
Nuclear reactions
oxides
Networks (circuits)
Autoclaves
Rutherford backscattering spectroscopy
Weighing
Electrochemical impedance spectroscopy
Electric properties
autoclaves
borates
nuclear reactions
Scanning electron microscopy
backscattering
electrical properties
impedance

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Oxide layers of Zr-1% Nb under PWR primary circuit conditions. / Nagy, Gabor; Kerner, Z.; Battistig, G.; Pintér-Csordás, Anna; Balog, J.; Pajkossy, T.

In: Journal of Nuclear Materials, Vol. 297, No. 1, 07.2001, p. 62-68.

Research output: Contribution to journalArticle

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