Optimal solutions for single fault localization in two dimensional lattice networks

J. Tapolcai, L. Rónyai, Pin Han Ho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

Achieving fast, precise, and scalable fault localization has long been a highly desired feature in all-optical mesh networks. Monitoring tree (m-tree) is an interesting method that has been introduced as the most general monitoring structure for achieving unambiguous failure localization (UFL). Ideally, with J m-trees one can monitor up to 2J - 1 links when a single failure has to be located. Such a logarithmic behavior has also been observed in numerous case studies of real life network topologies [1], [2]. It is expected that the m-tree framework will lead to a highly scalable link failure monitoring mechanism for not only all-optical mesh networks, but any possible future information system with mesh topologies, such as all-optical mesh networks, touch panels, quantum computing, and VLSI. It is an important task to investigate the extent such an optimal logarithmic behavior may hold, in particular in practically relevant network topologies. As an endeavor toward this goal, the paper investigates the problem by identifying essentially tight logarithmic bounds for two dimensional lattice networks. Experiments are conducted to show the feasibility and performance of the proposed constructions.

Original languageEnglish
Title of host publicationProceedings - IEEE INFOCOM
DOIs
Publication statusPublished - 2010
EventIEEE INFOCOM 2010 - San Diego, CA, United States
Duration: Mar 14 2010Mar 19 2010

Other

OtherIEEE INFOCOM 2010
CountryUnited States
CitySan Diego, CA
Period3/14/103/19/10

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Monitoring
Topology
Information systems
Experiments

ASJC Scopus subject areas

  • Computer Science(all)
  • Electrical and Electronic Engineering

Cite this

Optimal solutions for single fault localization in two dimensional lattice networks. / Tapolcai, J.; Rónyai, L.; Ho, Pin Han.

Proceedings - IEEE INFOCOM. 2010. 5462251.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tapolcai, J, Rónyai, L & Ho, PH 2010, Optimal solutions for single fault localization in two dimensional lattice networks. in Proceedings - IEEE INFOCOM., 5462251, IEEE INFOCOM 2010, San Diego, CA, United States, 3/14/10. https://doi.org/10.1109/INFCOM.2010.5462251
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