Optical properties of porous silicon. Part III

Comparison of experimental and theoretical results

A. Pap, Krisztián Kordás, Jouko Vähäkangas, Antti Uusimäki, Seppo Leppävuori, Laurent Pilon, S. Szatmári

Research output: Contribution to journalArticle

61 Citations (Scopus)

Abstract

In our previous study, the refractive indices of freestanding porous silicon (PS) layers were derived using the envelope method, where the computation is based on the values of local minima and maxima in the oscillations of transmission spectra. In the present work, an improved procedure for calculating the optical parameters from the measurements data is described. It is verified by reflection measurements on freestanding samples that optical scattering at the air-PS interface is the main reason for the loss of the transmitted light intensity and thus for the inaccurate results we obtained earlier by the envelope method. This however can be avoided by taking into consideration the relationship between the optical path in the plane-parallel film and the position of extrema in the transmission spectra. The as-determined effective refractive indices show very good matching with the theoretical calculations by the Bruggeman's effective medium approximation.

Original languageEnglish
Pages (from-to)506-513
Number of pages8
JournalOptical Materials
Volume28
Issue number5
DOIs
Publication statusPublished - Apr 2006

Fingerprint

Porous silicon
porous silicon
envelopes
Optical properties
refractivity
optical properties
Refractive index
range (extremes)
optical paths
luminous intensity
oscillations
air
approximation
scattering
Scattering
Air

Keywords

  • Effective medium approximation
  • Envelope method
  • Fresnel's equation
  • Optical reflection
  • Optical transmission
  • Porous silicon
  • Refractive index

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Optical properties of porous silicon. Part III : Comparison of experimental and theoretical results. / Pap, A.; Kordás, Krisztián; Vähäkangas, Jouko; Uusimäki, Antti; Leppävuori, Seppo; Pilon, Laurent; Szatmári, S.

In: Optical Materials, Vol. 28, No. 5, 04.2006, p. 506-513.

Research output: Contribution to journalArticle

Pap, A. ; Kordás, Krisztián ; Vähäkangas, Jouko ; Uusimäki, Antti ; Leppävuori, Seppo ; Pilon, Laurent ; Szatmári, S. / Optical properties of porous silicon. Part III : Comparison of experimental and theoretical results. In: Optical Materials. 2006 ; Vol. 28, No. 5. pp. 506-513.
@article{805cb79b765947049412a308bee1f62a,
title = "Optical properties of porous silicon. Part III: Comparison of experimental and theoretical results",
abstract = "In our previous study, the refractive indices of freestanding porous silicon (PS) layers were derived using the envelope method, where the computation is based on the values of local minima and maxima in the oscillations of transmission spectra. In the present work, an improved procedure for calculating the optical parameters from the measurements data is described. It is verified by reflection measurements on freestanding samples that optical scattering at the air-PS interface is the main reason for the loss of the transmitted light intensity and thus for the inaccurate results we obtained earlier by the envelope method. This however can be avoided by taking into consideration the relationship between the optical path in the plane-parallel film and the position of extrema in the transmission spectra. The as-determined effective refractive indices show very good matching with the theoretical calculations by the Bruggeman's effective medium approximation.",
keywords = "Effective medium approximation, Envelope method, Fresnel's equation, Optical reflection, Optical transmission, Porous silicon, Refractive index",
author = "A. Pap and Kriszti{\'a}n Kord{\'a}s and Jouko V{\"a}h{\"a}kangas and Antti Uusim{\"a}ki and Seppo Lepp{\"a}vuori and Laurent Pilon and S. Szatm{\'a}ri",
year = "2006",
month = "4",
doi = "10.1016/j.optmat.2005.02.006",
language = "English",
volume = "28",
pages = "506--513",
journal = "Optical Materials",
issn = "0925-3467",
publisher = "Elsevier",
number = "5",

}

TY - JOUR

T1 - Optical properties of porous silicon. Part III

T2 - Comparison of experimental and theoretical results

AU - Pap, A.

AU - Kordás, Krisztián

AU - Vähäkangas, Jouko

AU - Uusimäki, Antti

AU - Leppävuori, Seppo

AU - Pilon, Laurent

AU - Szatmári, S.

PY - 2006/4

Y1 - 2006/4

N2 - In our previous study, the refractive indices of freestanding porous silicon (PS) layers were derived using the envelope method, where the computation is based on the values of local minima and maxima in the oscillations of transmission spectra. In the present work, an improved procedure for calculating the optical parameters from the measurements data is described. It is verified by reflection measurements on freestanding samples that optical scattering at the air-PS interface is the main reason for the loss of the transmitted light intensity and thus for the inaccurate results we obtained earlier by the envelope method. This however can be avoided by taking into consideration the relationship between the optical path in the plane-parallel film and the position of extrema in the transmission spectra. The as-determined effective refractive indices show very good matching with the theoretical calculations by the Bruggeman's effective medium approximation.

AB - In our previous study, the refractive indices of freestanding porous silicon (PS) layers were derived using the envelope method, where the computation is based on the values of local minima and maxima in the oscillations of transmission spectra. In the present work, an improved procedure for calculating the optical parameters from the measurements data is described. It is verified by reflection measurements on freestanding samples that optical scattering at the air-PS interface is the main reason for the loss of the transmitted light intensity and thus for the inaccurate results we obtained earlier by the envelope method. This however can be avoided by taking into consideration the relationship between the optical path in the plane-parallel film and the position of extrema in the transmission spectra. The as-determined effective refractive indices show very good matching with the theoretical calculations by the Bruggeman's effective medium approximation.

KW - Effective medium approximation

KW - Envelope method

KW - Fresnel's equation

KW - Optical reflection

KW - Optical transmission

KW - Porous silicon

KW - Refractive index

UR - http://www.scopus.com/inward/record.url?scp=31644431514&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=31644431514&partnerID=8YFLogxK

U2 - 10.1016/j.optmat.2005.02.006

DO - 10.1016/j.optmat.2005.02.006

M3 - Article

VL - 28

SP - 506

EP - 513

JO - Optical Materials

JF - Optical Materials

SN - 0925-3467

IS - 5

ER -