Optical properties of porous silicon. Part I: Fabrication and investigation of single layers

Krisztián Kordás, A. Pap, Szabolcs Beke, Seppo Leppävuori

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

The wavelength dependent optical parameters such as refractive index n and absorption coefficient α of porous silicon (PS) have been calculated from optical transmission spectra of plan-parallel films having different porosities. Since the effects of manufacturing conditions on film porosity and thickness have been investigated as well, a complete set of data is obtained enabling the design and easy realization of PS layers with certain structural and optical properties in advanced applications for optoelectronics and sensors.

Original languageEnglish
Pages (from-to)251-255
Number of pages5
JournalOptical Materials
Volume25
Issue number3
DOIs
Publication statusPublished - Apr 2004

Fingerprint

Porous silicon
porous silicon
Optical properties
Porosity
porosity
optical properties
Fabrication
fabrication
Light transmission
Optoelectronic devices
Structural properties
Refractive index
absorptivity
manufacturing
refractivity
Wavelength
sensors
Sensors
coefficients
wavelengths

Keywords

  • Envelope function
  • Optical absorption
  • Porous silicon
  • Refractive index

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Optical properties of porous silicon. Part I : Fabrication and investigation of single layers. / Kordás, Krisztián; Pap, A.; Beke, Szabolcs; Leppävuori, Seppo.

In: Optical Materials, Vol. 25, No. 3, 04.2004, p. 251-255.

Research output: Contribution to journalArticle

Kordás, Krisztián ; Pap, A. ; Beke, Szabolcs ; Leppävuori, Seppo. / Optical properties of porous silicon. Part I : Fabrication and investigation of single layers. In: Optical Materials. 2004 ; Vol. 25, No. 3. pp. 251-255.
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