Optical beam deflection study of indium-hexacyanoferrate films

E. Csahók, E. Vieil, G. Inzelt

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Optical beam deflection technique was employed to follow the ion transport and ion exchange processes taking place in the course of redox transformations of indium-hexacyanoferrate surface layers. The data analysis by the help of a convolution method attested that the principal charge compensating ions are cations and the contribution of anions to the charge neutralization inside the film is less than a few percents in the range [0, 0.85 V].

Original languageEnglish
Pages (from-to)2687-2688
Number of pages2
JournalSynthetic Metals
Volume103
Issue number1-3
DOIs
Publication statusPublished - Jun 24 1999

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Indium
indium
deflection
Ions
ion charge
Convolution
convolution integrals
Anions
Cations
Ion exchange
surface layers
ions
Negative ions
Positive ions
anions
cations
ferrocyn
Oxidation-Reduction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Polymers and Plastics

Cite this

Optical beam deflection study of indium-hexacyanoferrate films. / Csahók, E.; Vieil, E.; Inzelt, G.

In: Synthetic Metals, Vol. 103, No. 1-3, 24.06.1999, p. 2687-2688.

Research output: Contribution to journalArticle

Csahók, E. ; Vieil, E. ; Inzelt, G. / Optical beam deflection study of indium-hexacyanoferrate films. In: Synthetic Metals. 1999 ; Vol. 103, No. 1-3. pp. 2687-2688.
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