Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films

M. Fried, P. Petrik, Z. Horváth, T. Lohner, C. Schmidt, C. Schneider, H. Ryssel

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Metal-organic chemical vapor deposition (MOCVD) made layers of strontium-bismuth-tantalate (SBT) were characterized by spectroscopic ellipsometry (SE) using the Adachi model [S. Adachi, Phys. Rev. B 35 (1987) 7454-7463]. The evaluated optical parameters were correlated with the physical and chemical behavior examined by X-ray diffraction (XRD). As a result, it was possible to fit the measured spectra with the Adachi model in a wide range covering the region of the band gap. The Adachi model provides electronic layer parameters like the transition energy E0 and broadening Γ. Our investigations established a correlation between XRD-determined average grain size and the electronic layer parameters.

Original languageEnglish
Pages (from-to)349-353
Number of pages5
JournalApplied Surface Science
Volume253
Issue number1 SPEC. ISS.
DOIs
Publication statusPublished - Oct 31 2006

Fingerprint

Bismuth
Strontium
strontium
bismuth
Ferroelectric materials
X rays
Thin films
thin films
Organic Chemicals
X ray diffraction
x rays
Spectroscopic ellipsometry
Organic chemicals
electronics
diffraction
ellipsometry
metalorganic chemical vapor deposition
Chemical vapor deposition
Energy gap
coverings

Keywords

  • Ferroelectric materials
  • Grain size
  • Spectroscopic ellipsometry
  • X-ray diffraction

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics

Cite this

Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films. / Fried, M.; Petrik, P.; Horváth, Z.; Lohner, T.; Schmidt, C.; Schneider, C.; Ryssel, H.

In: Applied Surface Science, Vol. 253, No. 1 SPEC. ISS., 31.10.2006, p. 349-353.

Research output: Contribution to journalArticle

@article{5b49c6318cd3494baf9cedd510681c63,
title = "Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films",
abstract = "Metal-organic chemical vapor deposition (MOCVD) made layers of strontium-bismuth-tantalate (SBT) were characterized by spectroscopic ellipsometry (SE) using the Adachi model [S. Adachi, Phys. Rev. B 35 (1987) 7454-7463]. The evaluated optical parameters were correlated with the physical and chemical behavior examined by X-ray diffraction (XRD). As a result, it was possible to fit the measured spectra with the Adachi model in a wide range covering the region of the band gap. The Adachi model provides electronic layer parameters like the transition energy E0 and broadening Γ. Our investigations established a correlation between XRD-determined average grain size and the electronic layer parameters.",
keywords = "Ferroelectric materials, Grain size, Spectroscopic ellipsometry, X-ray diffraction",
author = "M. Fried and P. Petrik and Z. Horv{\'a}th and T. Lohner and C. Schmidt and C. Schneider and H. Ryssel",
year = "2006",
month = "10",
day = "31",
doi = "10.1016/j.apsusc.2006.06.009",
language = "English",
volume = "253",
pages = "349--353",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",
number = "1 SPEC. ISS.",

}

TY - JOUR

T1 - Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films

AU - Fried, M.

AU - Petrik, P.

AU - Horváth, Z.

AU - Lohner, T.

AU - Schmidt, C.

AU - Schneider, C.

AU - Ryssel, H.

PY - 2006/10/31

Y1 - 2006/10/31

N2 - Metal-organic chemical vapor deposition (MOCVD) made layers of strontium-bismuth-tantalate (SBT) were characterized by spectroscopic ellipsometry (SE) using the Adachi model [S. Adachi, Phys. Rev. B 35 (1987) 7454-7463]. The evaluated optical parameters were correlated with the physical and chemical behavior examined by X-ray diffraction (XRD). As a result, it was possible to fit the measured spectra with the Adachi model in a wide range covering the region of the band gap. The Adachi model provides electronic layer parameters like the transition energy E0 and broadening Γ. Our investigations established a correlation between XRD-determined average grain size and the electronic layer parameters.

AB - Metal-organic chemical vapor deposition (MOCVD) made layers of strontium-bismuth-tantalate (SBT) were characterized by spectroscopic ellipsometry (SE) using the Adachi model [S. Adachi, Phys. Rev. B 35 (1987) 7454-7463]. The evaluated optical parameters were correlated with the physical and chemical behavior examined by X-ray diffraction (XRD). As a result, it was possible to fit the measured spectra with the Adachi model in a wide range covering the region of the band gap. The Adachi model provides electronic layer parameters like the transition energy E0 and broadening Γ. Our investigations established a correlation between XRD-determined average grain size and the electronic layer parameters.

KW - Ferroelectric materials

KW - Grain size

KW - Spectroscopic ellipsometry

KW - X-ray diffraction

UR - http://www.scopus.com/inward/record.url?scp=33750499296&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33750499296&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2006.06.009

DO - 10.1016/j.apsusc.2006.06.009

M3 - Article

VL - 253

SP - 349

EP - 353

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

IS - 1 SPEC. ISS.

ER -