Optical and structural characterization of Erbium-doped ion-implanted tellurite glasses for active integrated optical devices

S. Berneschi, M. Brenci, G. Nunzi Conti, S. Pelli, G. C. Righini, M. Bettinelli, A. Speghini, I. Bányász, M. Fried, N. Q. Khanh, F. Pászti, A. Watterich, A. Leto, G. Pezzotti, A. A. Porporati

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Erbium-doped tellurite glasses show great potential for the fabrication of high-performance integrated optical amplifiers and lasers, thanks to their unique properties in terms of bandwidth and rare earth solubility. As a first step towards the development of smart multi-functional integrated optical circuits, the fabrication of multimode channel waveguides in a sodium-tungsten-tellurite glass, by using nitrogen ions implantation, has been recently demonstrated [1]. The effects of the ion implantation process, however, have not been fully clarified, and a deeper investigation would be necessary in order to optimize the process and to truly exploit the glass useful characteristics. We therefore report here the results of a broad optical, topographic, and structural characterization of tellurite samples irradiated with various doses of nitrogen ions, while keeping constant the beam energy at 1.5 MeV. Characterization techniques have included absorption and luminescence spectroscopy, modal (dark-line) spectroscopy, surface profilometry, scanning electron microscopy, cathodoluminescence spectroscopy and EDX analysis.

Original languageEnglish
Title of host publicationCIMTEC 2008 - Proceedings of the 3rd International Conference on Smart Materials, Structures and Systems - Smart Optics
PublisherTrans Tech Publications Ltd
Pages68-73
Number of pages6
ISBN (Print)9783908158127
DOIs
Publication statusPublished - Jan 1 2008
Event3rd International Conference on Smart Materials, Structures and Systems - Smart Optics, CIMTEC 2008 - Acireale, Sicily, Italy
Duration: Jun 8 2008Jun 13 2008

Publication series

NameCIMTEC 2008 - Proceedings of the 3rd International Conference on Smart Materials, Structures and Systems - Smart Optics
Volume55

Other

Other3rd International Conference on Smart Materials, Structures and Systems - Smart Optics, CIMTEC 2008
CountryItaly
CityAcireale, Sicily
Period6/8/086/13/08

Keywords

  • Implantation
  • Ion-beam
  • Rare-earth
  • Tellurite glass
  • Waveguides

ASJC Scopus subject areas

  • Mechanics of Materials
  • Materials Science(all)

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    Berneschi, S., Brenci, M., Nunzi Conti, G., Pelli, S., Righini, G. C., Bettinelli, M., Speghini, A., Bányász, I., Fried, M., Khanh, N. Q., Pászti, F., Watterich, A., Leto, A., Pezzotti, G., & Porporati, A. A. (2008). Optical and structural characterization of Erbium-doped ion-implanted tellurite glasses for active integrated optical devices. In CIMTEC 2008 - Proceedings of the 3rd International Conference on Smart Materials, Structures and Systems - Smart Optics (pp. 68-73). (CIMTEC 2008 - Proceedings of the 3rd International Conference on Smart Materials, Structures and Systems - Smart Optics; Vol. 55). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/AST.55.68