Opryedyelyeniye sodyerzhaniya kisloroda v tonkikh plastinkakh kryemniya

I. Szép, I. Bársony

Research output: Contribution to journalArticle

Abstract

A survey is given on the transmission spectrum minima due to different oxide bonds on the surface of and in the silicon crystal. Methods are described for the investigation of the oxygen content of thin silicon slices. The oxygen concentration values of a few samples are determined and the bulk absorption cross-sections of different SiO2 groups are estimated.

Original languageEnglish
Pages (from-to)97-106
Number of pages10
JournalActa Physica Academiae Scientiarum Hungaricae
Volume29
Issue number2-3
DOIs
Publication statusPublished - Aug 1970

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silicon
oxygen
absorption cross sections
oxides
crystals

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

Cite this

Opryedyelyeniye sodyerzhaniya kisloroda v tonkikh plastinkakh kryemniya. / Szép, I.; Bársony, I.

In: Acta Physica Academiae Scientiarum Hungaricae, Vol. 29, No. 2-3, 08.1970, p. 97-106.

Research output: Contribution to journalArticle

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