We present a numerical simulation of excess noise aimed at monitoring degradation and failure of thin film resistors. A biased percolation model is used to introduce a generation of defects driven by local Joule heating. 1/f as well as Nyquist sources are considered. Equivalent noise temperatures, conveniently comparable with average thermal values, are obtained.
|Number of pages||4|
|Publication status||Published - Dec 1 1997|
|Event||Proceedings of the 1997 14th International Conference on Noise in Physical Systems and 1/f Fluctuations - Leuven, Belgium|
Duration: Jul 14 1997 → Jul 18 1997
|Other||Proceedings of the 1997 14th International Conference on Noise in Physical Systems and 1/f Fluctuations|
|Period||7/14/97 → 7/18/97|
ASJC Scopus subject areas