Numerical simulation of excess noise for degradation and failure of thin film resistors

C. Pennetta, Z. Gingl, L. B. Kiss, L. Reggiani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a numerical simulation of excess noise aimed at monitoring degradation and failure of thin film resistors. A biased percolation model is used to introduce a generation of defects driven by local Joule heating. 1/f as well as Nyquist sources are considered. Equivalent noise temperatures, conveniently comparable with average thermal values, are obtained.

Original languageEnglish
Title of host publicationProceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations
EditorsC. Claeys, E. Simoen
PublisherWorld Sci Publ Co Pte Ltd
Pages419-422
Number of pages4
Publication statusPublished - 1997
EventProceedings of the 1997 14th International Conference on Noise in Physical Systems and 1/f Fluctuations - Leuven, Belgium
Duration: Jul 14 1997Jul 18 1997

Other

OtherProceedings of the 1997 14th International Conference on Noise in Physical Systems and 1/f Fluctuations
CityLeuven, Belgium
Period7/14/977/18/97

Fingerprint

Joule heating
Resistors
Degradation
Thin films
Defects
Monitoring
Computer simulation
Temperature
Hot Temperature

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Pennetta, C., Gingl, Z., Kiss, L. B., & Reggiani, L. (1997). Numerical simulation of excess noise for degradation and failure of thin film resistors. In C. Claeys, & E. Simoen (Eds.), Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations (pp. 419-422). World Sci Publ Co Pte Ltd.

Numerical simulation of excess noise for degradation and failure of thin film resistors. / Pennetta, C.; Gingl, Z.; Kiss, L. B.; Reggiani, L.

Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations. ed. / C. Claeys; E. Simoen. World Sci Publ Co Pte Ltd, 1997. p. 419-422.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pennetta, C, Gingl, Z, Kiss, LB & Reggiani, L 1997, Numerical simulation of excess noise for degradation and failure of thin film resistors. in C Claeys & E Simoen (eds), Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations. World Sci Publ Co Pte Ltd, pp. 419-422, Proceedings of the 1997 14th International Conference on Noise in Physical Systems and 1/f Fluctuations, Leuven, Belgium, 7/14/97.
Pennetta C, Gingl Z, Kiss LB, Reggiani L. Numerical simulation of excess noise for degradation and failure of thin film resistors. In Claeys C, Simoen E, editors, Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations. World Sci Publ Co Pte Ltd. 1997. p. 419-422
Pennetta, C. ; Gingl, Z. ; Kiss, L. B. ; Reggiani, L. / Numerical simulation of excess noise for degradation and failure of thin film resistors. Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations. editor / C. Claeys ; E. Simoen. World Sci Publ Co Pte Ltd, 1997. pp. 419-422
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