Nonradiative transitions in x-ray analysis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Changes in the measured x-ray intensities caused by the presence of nonradiative transitions are not taken into account in the correction procedures used in electron probe x-ray microanalysis (EPMA). The author reviews for L lines which physical quantities are affected by the nonradiative transitions, how conventional EPMA can be successful without incorporating these effects, when the introduction of an effective fluorescence yield is an exact solution, and in which cases the subshells are to be calculated separately and the nonradiative transitions are to be explicitly incorporated.

Original languageEnglish
Title of host publicationProceedings, Annual Conference - Microbeam Analysis Society
EditorsJoseph R. Michael, Peter Ingram
PublisherPubl by San Francisco Press Inc
Pages29-31
Number of pages3
Publication statusPublished - 1990
EventProceedings of the 25th Annual Conference of the Microbeam Analysis Society presented at the 12th International Congress for Electron Microscopy - Seattle, WA, USA
Duration: Aug 12 1990Aug 18 1990

Other

OtherProceedings of the 25th Annual Conference of the Microbeam Analysis Society presented at the 12th International Congress for Electron Microscopy
CitySeattle, WA, USA
Period8/12/908/18/90

Fingerprint

Microanalysis
X rays
Electrons
Electron transitions
Fluorescence

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Lábár, J. (1990). Nonradiative transitions in x-ray analysis. In J. R. Michael, & P. Ingram (Eds.), Proceedings, Annual Conference - Microbeam Analysis Society (pp. 29-31). Publ by San Francisco Press Inc.

Nonradiative transitions in x-ray analysis. / Lábár, J.

Proceedings, Annual Conference - Microbeam Analysis Society. ed. / Joseph R. Michael; Peter Ingram. Publ by San Francisco Press Inc, 1990. p. 29-31.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lábár, J 1990, Nonradiative transitions in x-ray analysis. in JR Michael & P Ingram (eds), Proceedings, Annual Conference - Microbeam Analysis Society. Publ by San Francisco Press Inc, pp. 29-31, Proceedings of the 25th Annual Conference of the Microbeam Analysis Society presented at the 12th International Congress for Electron Microscopy, Seattle, WA, USA, 8/12/90.
Lábár J. Nonradiative transitions in x-ray analysis. In Michael JR, Ingram P, editors, Proceedings, Annual Conference - Microbeam Analysis Society. Publ by San Francisco Press Inc. 1990. p. 29-31
Lábár, J. / Nonradiative transitions in x-ray analysis. Proceedings, Annual Conference - Microbeam Analysis Society. editor / Joseph R. Michael ; Peter Ingram. Publ by San Francisco Press Inc, 1990. pp. 29-31
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