Changes in the measured x-ray intensities caused by the presence of nonradiative transitions are not taken into account in the correction procedures used in electron probe x-ray microanalysis (EPMA). The author reviews for L lines which physical quantities are affected by the nonradiative transitions, how conventional EPMA can be successful without incorporating these effects, when the introduction of an effective fluorescence yield is an exact solution, and in which cases the subshells are to be calculated separately and the nonradiative transitions are to be explicitly incorporated.
|Number of pages||3|
|Journal||Proceedings, Annual Conference - Microbeam Analysis Society|
|Publication status||Published - Dec 1 1990|
|Event||Proceedings of the 25th Annual Conference of the Microbeam Analysis Society presented at the 12th International Congress for Electron Microscopy - Seattle, WA, USA|
Duration: Aug 12 1990 → Aug 18 1990
ASJC Scopus subject areas