NIR techniques in yeast identification

Anna Halász, Amal Hassan, Árpá Tóth, M. Váradi

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

The suitability of near infrared reflectance spectroscopy (NIR) for the rapid identification of different yeasts was tested. Yeasts were grown in batch culture and samples were taken from the exponential and stationary growth stages; later samples were divided into aliquots, one of which was heat-shocked. The four yeasts tested were morphologically different. Optimal growth temperatures were all in the range of 30-35°C and at 30°C growth rates of mixed cultures did not differ significantly from those of monocultures. NIR spectra of the strains investigated were significantly different. The growth stage or heatshock treatment had significant effects on the spectrum. Mixtures of two pure cultures (0, 10, 20 . . . 90% "infection") had NIR spectra which were intermediate to those of the pure culture and even 10% contamination caused a significant difference.

Original languageEnglish
Pages (from-to)72-74
Number of pages3
JournalZeitschrift für Lebensmittel-Untersuchung und -Forschung
Volume204
Issue number1
Publication statusPublished - 1997

Fingerprint

Near-Infrared Spectroscopy
near-infrared spectroscopy
Yeast
Yeasts
Spectroscopy
yeasts
Infrared radiation
Growth
developmental stages
mixed culture
Growth temperature
Batch Cell Culture Techniques
Contamination
methodology
heat
sampling
Hot Temperature
infection
Temperature
temperature

Keywords

  • NIR technique
  • SDS-PAGE
  • Yeast identification

ASJC Scopus subject areas

  • Food Science

Cite this

NIR techniques in yeast identification. / Halász, Anna; Hassan, Amal; Tóth, Árpá; Váradi, M.

In: Zeitschrift für Lebensmittel-Untersuchung und -Forschung, Vol. 204, No. 1, 1997, p. 72-74.

Research output: Contribution to journalArticle

Halász, A, Hassan, A, Tóth, Á & Váradi, M 1997, 'NIR techniques in yeast identification', Zeitschrift für Lebensmittel-Untersuchung und -Forschung, vol. 204, no. 1, pp. 72-74.
Halász, Anna ; Hassan, Amal ; Tóth, Árpá ; Váradi, M. / NIR techniques in yeast identification. In: Zeitschrift für Lebensmittel-Untersuchung und -Forschung. 1997 ; Vol. 204, No. 1. pp. 72-74.
@article{626384788fdf476a96a205d5e65e303d,
title = "NIR techniques in yeast identification",
abstract = "The suitability of near infrared reflectance spectroscopy (NIR) for the rapid identification of different yeasts was tested. Yeasts were grown in batch culture and samples were taken from the exponential and stationary growth stages; later samples were divided into aliquots, one of which was heat-shocked. The four yeasts tested were morphologically different. Optimal growth temperatures were all in the range of 30-35°C and at 30°C growth rates of mixed cultures did not differ significantly from those of monocultures. NIR spectra of the strains investigated were significantly different. The growth stage or heatshock treatment had significant effects on the spectrum. Mixtures of two pure cultures (0, 10, 20 . . . 90{\%} {"}infection{"}) had NIR spectra which were intermediate to those of the pure culture and even 10{\%} contamination caused a significant difference.",
keywords = "NIR technique, SDS-PAGE, Yeast identification",
author = "Anna Hal{\'a}sz and Amal Hassan and {\'A}rp{\'a} T{\'o}th and M. V{\'a}radi",
year = "1997",
language = "English",
volume = "204",
pages = "72--74",
journal = "Zeitschrift fur Lebensmittel-Untersuchung und -Forschung",
issn = "1438-2377",
publisher = "Springer Verlag",
number = "1",

}

TY - JOUR

T1 - NIR techniques in yeast identification

AU - Halász, Anna

AU - Hassan, Amal

AU - Tóth, Árpá

AU - Váradi, M.

PY - 1997

Y1 - 1997

N2 - The suitability of near infrared reflectance spectroscopy (NIR) for the rapid identification of different yeasts was tested. Yeasts were grown in batch culture and samples were taken from the exponential and stationary growth stages; later samples were divided into aliquots, one of which was heat-shocked. The four yeasts tested were morphologically different. Optimal growth temperatures were all in the range of 30-35°C and at 30°C growth rates of mixed cultures did not differ significantly from those of monocultures. NIR spectra of the strains investigated were significantly different. The growth stage or heatshock treatment had significant effects on the spectrum. Mixtures of two pure cultures (0, 10, 20 . . . 90% "infection") had NIR spectra which were intermediate to those of the pure culture and even 10% contamination caused a significant difference.

AB - The suitability of near infrared reflectance spectroscopy (NIR) for the rapid identification of different yeasts was tested. Yeasts were grown in batch culture and samples were taken from the exponential and stationary growth stages; later samples were divided into aliquots, one of which was heat-shocked. The four yeasts tested were morphologically different. Optimal growth temperatures were all in the range of 30-35°C and at 30°C growth rates of mixed cultures did not differ significantly from those of monocultures. NIR spectra of the strains investigated were significantly different. The growth stage or heatshock treatment had significant effects on the spectrum. Mixtures of two pure cultures (0, 10, 20 . . . 90% "infection") had NIR spectra which were intermediate to those of the pure culture and even 10% contamination caused a significant difference.

KW - NIR technique

KW - SDS-PAGE

KW - Yeast identification

UR - http://www.scopus.com/inward/record.url?scp=0345100168&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0345100168&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0345100168

VL - 204

SP - 72

EP - 74

JO - Zeitschrift fur Lebensmittel-Untersuchung und -Forschung

JF - Zeitschrift fur Lebensmittel-Untersuchung und -Forschung

SN - 1438-2377

IS - 1

ER -