NIR techniques in yeast identification

Anna Halász, Amal Hassan, Árpá Tóth, Mária Váradi

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

The suitability of near infrared reflectance spectroscopy (NIR) for the rapid identification of different yeasts was tested. Yeasts were grown in batch culture and samples were taken from the exponential and stationary growth stages; later samples were divided into aliquots, one of which was heat-shocked. The four yeasts tested were morphologically different. Optimal growth temperatures were all in the range of 30-35°C and at 30°C growth rates of mixed cultures did not differ significantly from those of monocultures. NIR spectra of the strains investigated were significantly different. The growth stage or heatshock treatment had significant effects on the spectrum. Mixtures of two pure cultures (0, 10, 20 . . . 90% "infection") had NIR spectra which were intermediate to those of the pure culture and even 10% contamination caused a significant difference.

Original languageEnglish
Pages (from-to)72-74
Number of pages3
JournalZeitschrift fur Lebensmittel -Untersuchung und -Forschung
Volume204
Issue number1
Publication statusPublished - Dec 1 1997

Keywords

  • NIR technique
  • SDS-PAGE
  • Yeast identification

ASJC Scopus subject areas

  • Food Science

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