Nanoscale characterisation by SANS and residual stresses determination by neutron diffraction related to materials and components of technological interest

Massimo Rogante, László Rosta

Research output: Contribution to journalConference article

28 Citations (Scopus)

Abstract

Neutron techniques, among the other non-destructive diagnostics, are becoming more and more relevant in investigating materials and components of industrial interest. In this paper, Small Angle Neutron Scattering (SANS) for microstructural characterisation - especially related to the nanoscale - and Neutron Diffraction for Residual Stresses (RS) measurements are considered. The basic theoretical aspects and some industrial applications of each technique are described. In particular, RS determination in welding, in extruded specimens and in components for energy industry is reported. SANS measurements concerning materials and components for energy and automotive industry are finally presented.

Original languageEnglish
Article number46
Pages (from-to)294-305
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5824
DOIs
Publication statusPublished - Nov 16 2005
EventOpto-Ireland 2005: Nanotechnology and Nanophotonics - Dublin, Ireland
Duration: Apr 5 2005Apr 6 2005

Keywords

  • Industrial applications
  • Neutron techniques
  • Residual stresses
  • SANS

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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