Optical methods have been used for the sensitive characterization of surfaces and thin films for more than a century. The first ellipsometric measurement was conducted on metal surfaces by Paul Drude in 1889. The word 'ellipsometer' was first used by Rothen in a study of antigen-antibody interactions on polished metal surfaces in 1945. The 'bible' of ellipsometry has been published in the second half of the '70s. The publications in the topic of ellipsometry started to increase rapidly by the end of the '80s, together with concepts like surface plasmon resonance, later new topics like photonic crystals emerged. These techniques find applications in many fields, including sensorics or photovoltaics. In optical sensorics, the highest sensitivities were achieved by waveguide interferometry and plasmon resonance configurations. The instrumentation of ellipsometry is also being developed intensively towards higher sensitivity and performance by combinations with plasmonics, scatterometry, imaging or waveguide methods, utilizing the high sensitivity, high speed, non-destructive nature and mapping capabilities. Not only the instrumentation but also the methods of evaluation show a significant development, which leads to the characterization of structures with increasing complexity, including photonic, porous or metal surfaces. This article discusses a selection of interesting applications of photonics in the Centre for Energy Research of the Hungarian Academy of Sciences.
|Journal||Journal of Physics: Conference Series|
|Publication status||Published - Feb 22 2017|
|Event||19th International School on Condensed Matter Physics - Advances in Nanostructured Condensed Matter: Research and Innovations, ISCMP 2016 - Varna, Bulgaria|
Duration: Aug 28 2016 → Sep 2 2016
ASJC Scopus subject areas
- Physics and Astronomy(all)