Nanocrystalline materials studied by powder diffraction line profile analysis

Research output: Contribution to journalArticle

38 Citations (Scopus)

Abstract

X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain. It is widely applied for nanocrystalline materials, especially since other methods, in particular electron microscopy is, on the one hand tedious and time consuming, on the other hand, due to the often metastable states of nanomaterials it might change their microstructures. It is attempted to overview the applications of microstructure characterization by powder diffraction on nanocrystalline metals, alloys, ceramics and carbon base materials. Whenever opportunity is given, the data provided by the X-ray method are compared and discussed together with results of electron microscopy. Since the topic is vast we do not try to cover the entire field.

Original languageEnglish
Pages (from-to)114-128
Number of pages15
JournalZeitschrift fur Kristallographie
Volume222
Issue number3-4
DOIs
Publication statusPublished - 2007

Fingerprint

Nanocrystalline materials
nanocrystals
Electron microscopy
microstructure
Microstructure
electron microscopy
Metal Ceramic Alloys
profiles
diffraction
Nanostructured materials
metastable state
X ray powder diffraction
x rays
Carbon
ceramics
Crystalline materials
X rays
carbon
Metals
metals

Keywords

  • Crystallite size
  • Dislocations
  • Line profile analysis
  • Microstrain
  • Nanocrystals
  • Slip systems
  • Subgrains
  • X-ray powder diffraction

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Nanocrystalline materials studied by powder diffraction line profile analysis. / Ungár, T.; Gubicza, J.

In: Zeitschrift fur Kristallographie, Vol. 222, No. 3-4, 2007, p. 114-128.

Research output: Contribution to journalArticle

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