Nanocrystalline materials studied by powder diffraction line profile analysis

Research output: Contribution to journalReview article

38 Citations (Scopus)

Abstract

X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain. It is widely applied for nanocrystalline materials, especially since other methods, in particular electron microscopy is, on the one hand tedious and time consuming, on the other hand, due to the often metastable states of nanomaterials it might change their microstructures. It is attempted to overview the applications of microstructure characterization by powder diffraction on nanocrystalline metals, alloys, ceramics and carbon base materials. Whenever opportunity is given, the data provided by the X-ray method are compared and discussed together with results of electron microscopy. Since the topic is vast we do not try to cover the entire field.

Original languageEnglish
Pages (from-to)114-128
Number of pages15
JournalZeitschrift fur Kristallographie
Volume222
Issue number3-4
DOIs
Publication statusPublished - Mar 30 2007

Keywords

  • Crystallite size
  • Dislocations
  • Line profile analysis
  • Microstrain
  • Nanocrystals
  • Slip systems
  • Subgrains
  • X-ray powder diffraction

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Inorganic Chemistry

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