Multiprotocol MR image segmentation in Multiple Sclerosis: Experience with over 1000 studies

Jayaram K. Udupa, Laszlo G. Nyul, Yulin Ge, Robert I. Grossman

Research output: Contribution to journalConference article

2 Citations (Scopus)


Multiple Sclerosis (MS) is an acquired disease of the central nervous system. Subjective cognitive and ambulatory test scores on a scale called EDSS are currently utilized to assess the disease severity. Various MRI protocols are being investigated to study the disease based on how it manifests itself in the images. In an attempt to eventually replace EDSS by an objective measure to assess the natural course of the disease and its response to therapy, we have developed image segmentation methods based on fuzzy connectedness to quantify various objects in multiprotocol MRI. These include the macroscopic objects such as lesions, the grey matter (GM), white matter (WM), cerebrospinal fluid (CSF), and brain parenchyma as well as the microscopic aspects of the diseased WM. Over 1000 studies have been processed to date. By far the strongest correlations with the clinical measures were demonstrated by the Magnetization Transfer Ratio (MTR) histogram parameters obtained for the various segmented tissue regions emphasizing the importance of considering the microscopic/diffused nature of the disease in the individual tissue regions. Brain parenchymal volume also demonstrated a strong correlation with the clinical measures indicating that brain atrophy is an important indicator of the disease. Fuzzy connectedness is a viable segmentation method for studying MS.

Original languageEnglish
Pages (from-to)I/-
JournalProceedings of SPIE - The International Society for Optical Engineering
Publication statusPublished - Jan 1 2000
EventMedical Imaging 2000: Image Processing - San Diego, CA, USA
Duration: Feb 14 2000Feb 17 2000


ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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