Multiple ionization of M- and N-shells in heavy atoms by O, Si and S ions

D. Banaś, J. Braziewicz, U. Majewska, M. Pajek, J. Semaniak, T. Czyzewski, M. Jaskóla, W. Kretschmer, T. Mukoyama

Research output: Contribution to journalConference article

25 Citations (Scopus)


Multiple ionization in M- and N-shells in solid Au, Bi, Th and U targets was studied for O, Si and S ions of energies 0.4-2.0 MeV/amu. Lγ X-rays measured with semiconductor Si(Li) detector were analysed by using a newly developed method of the simultaneous determination of X-ray energy shifts and line broadening caused by the multiple ionization in outer shells. In this approach both X-ray energy shifts and widths are expressed in terms of ionization probabilities and calculated energy shifts per vacancy, allowing thus the unique fitting of the Lγ X-rays and determination of ionization probabilities. Derived ionization probabilities for M- and N-shells exhibit universal scaling predicted by the geometrical model (GM) for the ionization probabilities at the zero impact parameter. The influence of time evolution of the vacancies formed in M- and N-shells by ion impact is discussed.

Original languageEnglish
Pages (from-to)247-251
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Issue number1-4
Publication statusPublished - Jun 3 1999
EventProceedings of the 1998 7th Workshop on Fast Ion-Atom Collisions - Debrecen, Hung
Duration: Sep 9 1998Sep 11 1998


ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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