Multiple ionization in M- and N-shells in solid Au, Bi, Th and U targets was studied for O, Si and S ions of energies 0.4-2.0 MeV/amu. Lγ X-rays measured with semiconductor Si(Li) detector were analysed by using a newly developed method of the simultaneous determination of X-ray energy shifts and line broadening caused by the multiple ionization in outer shells. In this approach both X-ray energy shifts and widths are expressed in terms of ionization probabilities and calculated energy shifts per vacancy, allowing thus the unique fitting of the Lγ X-rays and determination of ionization probabilities. Derived ionization probabilities for M- and N-shells exhibit universal scaling predicted by the geometrical model (GM) for the ionization probabilities at the zero impact parameter. The influence of time evolution of the vacancies formed in M- and N-shells by ion impact is discussed.
|Number of pages||5|
|Journal||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms|
|Publication status||Published - Jun 3 1999|
|Event||Proceedings of the 1998 7th Workshop on Fast Ion-Atom Collisions - Debrecen, Hung|
Duration: Sep 9 1998 → Sep 11 1998
ASJC Scopus subject areas
- Nuclear and High Energy Physics