Multiple-beam x-ray diffraction near exact backscattering in silicon

J. P. Sutter, E. E. Alp, M. Y. Hu, P. L. Lee, H. Sinn, W. Sturhahn, T. S. Toellner, G. Bortel, R. Colella

Research output: Contribution to journalArticle

35 Citations (Scopus)

Abstract

We examined multiple-beam effects accompanying a backscattering Bragg reflection from a silicon crystal. Silicon crystals are frequently used in x-ray diffraction applications due to their high degree of perfection. Backscattering Bragg reflections have been employed for x-ray monochromatization, energy analysis, and other tasks. Multiple-beam effects have been found to be unavoidable for backscattering of hard x-rays from silicon, but little experimental data had previously been collected on these effects. Detailed rocking curves of the (12 4 0) Bragg reflection near backscattering are included and compared to the predictions of the dynamical diffraction theory. Intensity data of the accompanying reflected beams are also provided.

Original languageEnglish
Article number094111
Pages (from-to)941111-9411112
Number of pages8470002
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume63
Issue number9
Publication statusPublished - 2001

Fingerprint

Silicon
Backscattering
backscattering
x ray diffraction
Diffraction
X rays
silicon
monochromatization
Crystals
crystals
x rays
curves
predictions
diffraction
energy

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Sutter, J. P., Alp, E. E., Hu, M. Y., Lee, P. L., Sinn, H., Sturhahn, W., ... Colella, R. (2001). Multiple-beam x-ray diffraction near exact backscattering in silicon. Physical Review B - Condensed Matter and Materials Physics, 63(9), 941111-9411112. [094111].

Multiple-beam x-ray diffraction near exact backscattering in silicon. / Sutter, J. P.; Alp, E. E.; Hu, M. Y.; Lee, P. L.; Sinn, H.; Sturhahn, W.; Toellner, T. S.; Bortel, G.; Colella, R.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 63, No. 9, 094111, 2001, p. 941111-9411112.

Research output: Contribution to journalArticle

Sutter, JP, Alp, EE, Hu, MY, Lee, PL, Sinn, H, Sturhahn, W, Toellner, TS, Bortel, G & Colella, R 2001, 'Multiple-beam x-ray diffraction near exact backscattering in silicon', Physical Review B - Condensed Matter and Materials Physics, vol. 63, no. 9, 094111, pp. 941111-9411112.
Sutter JP, Alp EE, Hu MY, Lee PL, Sinn H, Sturhahn W et al. Multiple-beam x-ray diffraction near exact backscattering in silicon. Physical Review B - Condensed Matter and Materials Physics. 2001;63(9):941111-9411112. 094111.
Sutter, J. P. ; Alp, E. E. ; Hu, M. Y. ; Lee, P. L. ; Sinn, H. ; Sturhahn, W. ; Toellner, T. S. ; Bortel, G. ; Colella, R. / Multiple-beam x-ray diffraction near exact backscattering in silicon. In: Physical Review B - Condensed Matter and Materials Physics. 2001 ; Vol. 63, No. 9. pp. 941111-9411112.
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