Multielectron excitations of Ni and Zn in X-ray absorption

Yoshiaki Ito, Hirohide Nakamatsu, T. Mukoyama, Kazuhiko Omote, Shinzo Yoshikado

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The x-ray absorption measurements of Ni and Zn are carried out at various temperature in the energy region where multiple transitions are expected. XAFS oscillations mask the K+L transition edges of these elements and extend up to over 20 A-1. In the synchrotron radiation facility, the sensitivity of about 5xl0"4 in the detection is experimentally achieved in the energy region of multiexcitations. However, no features attributed to multiple photoexcitation are detected in the spectra. The result can be explained by theoretical predictions due to lower shakeup probabilities for K+L transitions in Ni and Zn.

Original languageEnglish
Pages (from-to)58-60
Number of pages3
JournalJapanese Journal of Applied Physics
Volume32
DOIs
Publication statusPublished - 1993

Fingerprint

Photoexcitation
X ray absorption
Synchrotron radiation
Masks
X rays
excitation
x rays
photoexcitation
x ray absorption
Temperature
synchrotron radiation
masks
oscillations
energy
sensitivity
predictions
temperature

Keywords

  • Multielectron transition
  • Ni
  • Shakeoff
  • Shakeup
  • X-ray absorption
  • Zn

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Multielectron excitations of Ni and Zn in X-ray absorption. / Ito, Yoshiaki; Nakamatsu, Hirohide; Mukoyama, T.; Omote, Kazuhiko; Yoshikado, Shinzo.

In: Japanese Journal of Applied Physics, Vol. 32, 1993, p. 58-60.

Research output: Contribution to journalArticle

Ito, Yoshiaki ; Nakamatsu, Hirohide ; Mukoyama, T. ; Omote, Kazuhiko ; Yoshikado, Shinzo. / Multielectron excitations of Ni and Zn in X-ray absorption. In: Japanese Journal of Applied Physics. 1993 ; Vol. 32. pp. 58-60.
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