Morphology, surface roughness, electron inelastic and quasielastic scattering in elastic peak electron spectroscopy of polymers

B. Lesiak, A. Kosiński, R. Nowakowski, L. Kövér, J. Tóth, D. Varga, I. Cserny, A. Sulyok, G. Gergely

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

In elastic peak electron spectroscopy (EPES), the nearest vicinity of elastic peak in the low kinetic energy region reflects electron inelastic and quasielastic processes. Incident electrons produce surface excitations, inducing surface plasmons, with the corresponding loss peaks separated by 1-20 eV energy from the elastic peak. In this work, X-ray photoelectron spectroscopy (XPS) and helium pycnometry are applied for determining surface atomic composition and bulk density, whereas atomic force microscopy (AFM) is applied for determining surface morphology and roughness. The component due to electron recoil on hydrogen atoms can be observed in EPES spectra for selected primary electron energies. Simulations of EPES predict a larger contribution of the hydrogen component than observed experimentally, where hydrogen deficiency is observed. Elastic peak intensity is influenced more strongly by surface morphology (roughness and porosity) than by surface excitations and quasielastic scattering of electrons by hydrogen atoms.

Original languageEnglish
Pages (from-to)798-804
Number of pages7
JournalSurface and Interface Analysis
Volume39
Issue number10
DOIs
Publication statusPublished - Oct 1 2007

    Fingerprint

Keywords

  • Elastic peak electron spectroscopy
  • Electron inelastic and quasielastic scattering
  • Polymers
  • Surface morphology and roughness

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this