Monocular image-based time to collision and closest point of approach estimation

Peter Bauer, Antal Hiba, Balint Vanek, A. Zarándy, J. Bokor

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

This paper deals with monocular image-based time-to-collision (TTC) and closest point of approach (CPA) estimation for aircraft sense and avoid. First, it proposes a disc-based pinhole camera projection model which can better represent a real 3D object. Then it proposes simple least squares optimal line fitting-based techniques for TTC and CPA estimation based-on measurable image parameters only. Possible errors in the image are considered through design nomograms and a collision decision threshold selection technique is presented. Theoretical results are verified through software-in-the-loop simulation and real flight test results. To the best of the author's knowledge the disc-based projection model and the line fit-based TTC and CPA estimation are new contributions in this field.

Original languageEnglish
Title of host publication24th Mediterranean Conference on Control and Automation, MED 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1168-1173
Number of pages6
ISBN (Electronic)9781467383455
DOIs
Publication statusPublished - Aug 5 2016
Event24th Mediterranean Conference on Control and Automation, MED 2016 - Athens, Greece
Duration: Jun 21 2016Jun 24 2016

Other

Other24th Mediterranean Conference on Control and Automation, MED 2016
CountryGreece
CityAthens
Period6/21/166/24/16

Keywords

  • Closest point of approach
  • Monocular camera
  • Sense and avoid
  • Time to collision

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Control and Optimization
  • Modelling and Simulation

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  • Cite this

    Bauer, P., Hiba, A., Vanek, B., Zarándy, A., & Bokor, J. (2016). Monocular image-based time to collision and closest point of approach estimation. In 24th Mediterranean Conference on Control and Automation, MED 2016 (pp. 1168-1173). [7535965] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MED.2016.7535965