Molecular Structure of Silicon Tetraiodide

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Abstract

The molecular geometry of silicon tetraiodide was determined by gas-phase electron diffraction at 378 K. The molecule has a regular tetrahedral shape with an Si - I bond length (rg) of 2.432(5) Å and an I⋯I nonbonded distance (rg) of 3.971(8) Å. There is an apparent anharmonicity in both the stretching and the bending vibrations, with the latter especially pronounced.

Original languageEnglish
Pages (from-to)349-352
Number of pages4
JournalStructural Chemistry
Volume9
Issue number5
DOIs
Publication statusPublished - Jan 1 1998

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Keywords

  • Electron diffraction
  • Molecular structure
  • Normal coordinate analysis
  • Silicon tetraiodide

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Physical and Theoretical Chemistry

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