In X‐ray diffraction experiments smearing effects due to instrumental resolution are appearing. Correction of these effects is not simple because of the statistical disturbances and limited a‐priori informations. A recursive algorithm is produced from the Bayes estimation theory. The regularization process is interpreted as a certain a‐priori information on the degree of smoothness of the real diffraction pattern.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics