Modified Statistical Regularization in X‐Ray Line Profile Analysis

V. A. Trubin, A. Szasz

Research output: Contribution to journalArticle

1 Citation (Scopus)


In X‐ray diffraction experiments smearing effects due to instrumental resolution are appearing. Correction of these effects is not simple because of the statistical disturbances and limited a‐priori informations. A recursive algorithm is produced from the Bayes estimation theory. The regularization process is interpreted as a certain a‐priori information on the degree of smoothness of the real diffraction pattern.

Original languageEnglish
Pages (from-to)387-391
Number of pages5
Journalphysica status solidi (a)
Issue number2
Publication statusPublished - Apr 16 1991

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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