Modified Statistical Regularization in X‐Ray Line Profile Analysis

V. A. Trubin, A. Szasz

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In X‐ray diffraction experiments smearing effects due to instrumental resolution are appearing. Correction of these effects is not simple because of the statistical disturbances and limited a‐priori informations. A recursive algorithm is produced from the Bayes estimation theory. The regularization process is interpreted as a certain a‐priori information on the degree of smoothness of the real diffraction pattern.

Original languageEnglish
Pages (from-to)387-391
Number of pages5
Journalphysica status solidi (a)
Volume124
Issue number2
DOIs
Publication statusPublished - Apr 16 1991

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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