Modelling measurement technical problems with constraints

Gyula Román, T. Dobrowiecki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Interdisciplinary applications exposed new interesting, but difficult problems in the field of measurement. Such applications put emphasis on the automation of the measurement process on the whole. The analysis of how the experiments are planned, controlled, evaluated, etc. brought into focus the question of how well the expert knowledge related to the measurement can be represented and utilised in the development of autonomous intelligent measurement systems [14]. Methods developed in the field of Artificial Intelligence (AI) lend themselves naturally for such applications. The present paper proposes so called constraints to be used as the knowledge representation tool in modelling measurements. When a deeper model of the phenomena underlying the measurement processes is needed, applying constraints as knowledge representation is potentially fruitful, considering how well they express the dependencies between different subsystems and state variables of the physical systems. Authors review measurement technical problems suited for the constraint based knowledge representation, analyse the requirements of the actual constraint satisfaction problems and evaluate the known methodology from that perspective.

Original languageEnglish
Title of host publicationConference Proceedings - 10th Anniv., IMTC 1994
Subtitle of host publicationAdvanced Technologies in I and M. 1994 IEEE Instrumentation and Measurement Technology Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages94-97
Number of pages4
ISBN (Electronic)0780318803, 9780780318809
DOIs
Publication statusPublished - Jan 1 1994
Event1994 IEEE Instrumentation and Measurement Technology Conference, IMTC 1994 - Hamamatsu, Japan
Duration: May 10 1994May 12 1994

Publication series

NameConference Proceedings - 10th Anniv., IMTC 1994: Advanced Technologies in I and M. 1994 IEEE Instrumentation and Measurement Technology Conference

Conference

Conference1994 IEEE Instrumentation and Measurement Technology Conference, IMTC 1994
CountryJapan
CityHamamatsu
Period5/10/945/12/94

Keywords

  • Constraint Optimisation Problem (COP)
  • Constraint Satisfaction Problem (CSP)
  • Constraints
  • Experiment planning
  • Knowledge representation
  • Measurement

ASJC Scopus subject areas

  • Acoustics and Ultrasonics
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Modelling measurement technical problems with constraints'. Together they form a unique fingerprint.

  • Cite this

    Román, G., & Dobrowiecki, T. (1994). Modelling measurement technical problems with constraints. In Conference Proceedings - 10th Anniv., IMTC 1994: Advanced Technologies in I and M. 1994 IEEE Instrumentation and Measurement Technology Conference (pp. 94-97). [352118] (Conference Proceedings - 10th Anniv., IMTC 1994: Advanced Technologies in I and M. 1994 IEEE Instrumentation and Measurement Technology Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMTC.1994.352118