Mid- and near-IR ellipsometry of Y1-xPrxBa2Cu3O7 epitaxial films

J. Humlicek, K. Kamarás, J. Kircher, H. U. Habermeier, M. Cardona, A. Roeseler, J. L. Stehle

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We have determined the optical response of Y1-xPrxBa2Cu3O7 for several compositions x from 0 to 1 using multiple-angle-of-incidence ellipsometry. The spectral range from 58 to 1800 meV was covered with two Fourier transform ellipsometers and a conventional dispersive rotating-analyser instrument. Epitaxial (001) films with very smooth surfaces were grown by pulsed laser deposition from ceramic targets on strontium titanate. The gradual reduction in the superconducting transition temperature with x increasing from 0 to 0.5 is found to be accompanied by pronounced changes in the normal-state optical response. We exploit the advantage of both real and imaginary parts of the response functions being obtained simultaneously at each photon energy. This enables us to investigate specific spectral features of the dielectric function, conductivity, and loss function.

Original languageEnglish
Pages (from-to)518-521
Number of pages4
JournalThin Solid Films
Volume234
Issue number1-2
DOIs
Publication statusPublished - Oct 25 1993

Fingerprint

Epitaxial films
Ellipsometry
ellipsometry
ellipsometers
Strontium
Pulsed laser deposition
strontium
Superconducting transition temperature
pulsed laser deposition
Fourier transforms
Photons
incidence
transition temperature
ceramics
conductivity
photons
Chemical analysis
energy

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Humlicek, J., Kamarás, K., Kircher, J., Habermeier, H. U., Cardona, M., Roeseler, A., & Stehle, J. L. (1993). Mid- and near-IR ellipsometry of Y1-xPrxBa2Cu3O7 epitaxial films. Thin Solid Films, 234(1-2), 518-521. https://doi.org/10.1016/0040-6090(93)90321-F

Mid- and near-IR ellipsometry of Y1-xPrxBa2Cu3O7 epitaxial films. / Humlicek, J.; Kamarás, K.; Kircher, J.; Habermeier, H. U.; Cardona, M.; Roeseler, A.; Stehle, J. L.

In: Thin Solid Films, Vol. 234, No. 1-2, 25.10.1993, p. 518-521.

Research output: Contribution to journalArticle

Humlicek, J, Kamarás, K, Kircher, J, Habermeier, HU, Cardona, M, Roeseler, A & Stehle, JL 1993, 'Mid- and near-IR ellipsometry of Y1-xPrxBa2Cu3O7 epitaxial films', Thin Solid Films, vol. 234, no. 1-2, pp. 518-521. https://doi.org/10.1016/0040-6090(93)90321-F
Humlicek J, Kamarás K, Kircher J, Habermeier HU, Cardona M, Roeseler A et al. Mid- and near-IR ellipsometry of Y1-xPrxBa2Cu3O7 epitaxial films. Thin Solid Films. 1993 Oct 25;234(1-2):518-521. https://doi.org/10.1016/0040-6090(93)90321-F
Humlicek, J. ; Kamarás, K. ; Kircher, J. ; Habermeier, H. U. ; Cardona, M. ; Roeseler, A. ; Stehle, J. L. / Mid- and near-IR ellipsometry of Y1-xPrxBa2Cu3O7 epitaxial films. In: Thin Solid Films. 1993 ; Vol. 234, No. 1-2. pp. 518-521.
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