Microstructure of post-deformed ECAP-Ti investigated by Multiple X-ray Line Profile Analysis

E. Schafler, K. Nyilas, S. Bernstorff, L. Zeipper, M. Zehetbauer, T. Ungár

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

99.5% pure α-Ti was deformed by equal channel angular pressing (ECAP) at 450°C for 8 passes in route BC. Samples which were manufactured out of the bulk have been deformed by compression up to 80% true strain and analysed by Multi reflection X-ray Line Profile Analysis (MXPA). It turned out that from the 11 slip systems possible in hexagonal Ti only those with Burgers vector b1 = 1/3 〈 110〉 (〈a〉 type) and b3 = 1/3 〈 113〉 (〈c+a〉 type) have been activated during compression. After the ECAP deformation area weighted mean of the coherently scattering domain size has a relatively small value of about 40 nm. During the additional compression it stays fairly constant, whereas the size distribution function broadens slightly. After the ECAP process the dislocation density is considerably high at 2×1015 m-2 and increases up to 5 times with growing post-deformation.

Original languageEnglish
Pages (from-to)129-134
Number of pages6
JournalZeitschrift fur Kristallographie, Supplement
Volume1
Issue number23
Publication statusPublished - 2006

Fingerprint

Equal channel angular pressing
pressing
X rays
microstructure
Microstructure
profiles
Burgers vector
x rays
guy wires
Distribution functions
slip
distribution functions
routes
Scattering
scattering

Keywords

  • Dislocation structure
  • Line profile analysis
  • Severe plastic deformation

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Science(all)

Cite this

Microstructure of post-deformed ECAP-Ti investigated by Multiple X-ray Line Profile Analysis. / Schafler, E.; Nyilas, K.; Bernstorff, S.; Zeipper, L.; Zehetbauer, M.; Ungár, T.

In: Zeitschrift fur Kristallographie, Supplement, Vol. 1, No. 23, 2006, p. 129-134.

Research output: Contribution to journalArticle

Schafler, E, Nyilas, K, Bernstorff, S, Zeipper, L, Zehetbauer, M & Ungár, T 2006, 'Microstructure of post-deformed ECAP-Ti investigated by Multiple X-ray Line Profile Analysis', Zeitschrift fur Kristallographie, Supplement, vol. 1, no. 23, pp. 129-134.
Schafler, E. ; Nyilas, K. ; Bernstorff, S. ; Zeipper, L. ; Zehetbauer, M. ; Ungár, T. / Microstructure of post-deformed ECAP-Ti investigated by Multiple X-ray Line Profile Analysis. In: Zeitschrift fur Kristallographie, Supplement. 2006 ; Vol. 1, No. 23. pp. 129-134.
@article{5de7d3e3e4c14922a4bc9c52d6a943c5,
title = "Microstructure of post-deformed ECAP-Ti investigated by Multiple X-ray Line Profile Analysis",
abstract = "99.5{\%} pure α-Ti was deformed by equal channel angular pressing (ECAP) at 450°C for 8 passes in route BC. Samples which were manufactured out of the bulk have been deformed by compression up to 80{\%} true strain and analysed by Multi reflection X-ray Line Profile Analysis (MXPA). It turned out that from the 11 slip systems possible in hexagonal Ti only those with Burgers vector b1 = 1/3 〈 110〉 (〈a〉 type) and b3 = 1/3 〈 113〉 (〈c+a〉 type) have been activated during compression. After the ECAP deformation area weighted mean of the coherently scattering domain size has a relatively small value of about 40 nm. During the additional compression it stays fairly constant, whereas the size distribution function broadens slightly. After the ECAP process the dislocation density is considerably high at 2×1015 m-2 and increases up to 5 times with growing post-deformation.",
keywords = "Dislocation structure, Line profile analysis, Severe plastic deformation",
author = "E. Schafler and K. Nyilas and S. Bernstorff and L. Zeipper and M. Zehetbauer and T. Ung{\'a}r",
year = "2006",
language = "English",
volume = "1",
pages = "129--134",
journal = "Zeitschrift fur Kristallographie, Supplement",
issn = "0930-486X",
publisher = "R. Oldenbourg",
number = "23",

}

TY - JOUR

T1 - Microstructure of post-deformed ECAP-Ti investigated by Multiple X-ray Line Profile Analysis

AU - Schafler, E.

AU - Nyilas, K.

AU - Bernstorff, S.

AU - Zeipper, L.

AU - Zehetbauer, M.

AU - Ungár, T.

PY - 2006

Y1 - 2006

N2 - 99.5% pure α-Ti was deformed by equal channel angular pressing (ECAP) at 450°C for 8 passes in route BC. Samples which were manufactured out of the bulk have been deformed by compression up to 80% true strain and analysed by Multi reflection X-ray Line Profile Analysis (MXPA). It turned out that from the 11 slip systems possible in hexagonal Ti only those with Burgers vector b1 = 1/3 〈 110〉 (〈a〉 type) and b3 = 1/3 〈 113〉 (〈c+a〉 type) have been activated during compression. After the ECAP deformation area weighted mean of the coherently scattering domain size has a relatively small value of about 40 nm. During the additional compression it stays fairly constant, whereas the size distribution function broadens slightly. After the ECAP process the dislocation density is considerably high at 2×1015 m-2 and increases up to 5 times with growing post-deformation.

AB - 99.5% pure α-Ti was deformed by equal channel angular pressing (ECAP) at 450°C for 8 passes in route BC. Samples which were manufactured out of the bulk have been deformed by compression up to 80% true strain and analysed by Multi reflection X-ray Line Profile Analysis (MXPA). It turned out that from the 11 slip systems possible in hexagonal Ti only those with Burgers vector b1 = 1/3 〈 110〉 (〈a〉 type) and b3 = 1/3 〈 113〉 (〈c+a〉 type) have been activated during compression. After the ECAP deformation area weighted mean of the coherently scattering domain size has a relatively small value of about 40 nm. During the additional compression it stays fairly constant, whereas the size distribution function broadens slightly. After the ECAP process the dislocation density is considerably high at 2×1015 m-2 and increases up to 5 times with growing post-deformation.

KW - Dislocation structure

KW - Line profile analysis

KW - Severe plastic deformation

UR - http://www.scopus.com/inward/record.url?scp=33846417990&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33846417990&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:33846417990

VL - 1

SP - 129

EP - 134

JO - Zeitschrift fur Kristallographie, Supplement

JF - Zeitschrift fur Kristallographie, Supplement

SN - 0930-486X

IS - 23

ER -