Microstructure of post-deformed ECAP-Ti investigated by multiple X-ray line profile analysis

E. Schafler, K. Nyilas, S. Bernstorff, L. Zeipper, M. Zehetbauer, T. Ungàr

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2 Citations (Scopus)

Abstract

99.5% pure α-Ti was deformed by equal channel angular pressing (ECAP) at 450°C for 8 passes in route BC. Samples which were manufactured out of the bulk have been deformed by compression up to 80% true strain and analysed by Multi reflection X-ray Line Profile Analysis (MXPA). It turned out that from the 11 slip systems possible in hexagonal Ti only those with Burgers vector b1 = 1/3 〈110〉 (〈a〉 type) and b3 = 1/3 〈113〉 (〈c+a〉 type) have been activated during compression. After the ECAP deformation area weighted mean of the coherently scattering domain size has a relatively small value of about 40 nm. During the additional compression it stays fairly constant, whereas the size distribution function broadens slightly. After the ECAP process the dislocation density is considerably high at 2×1015 m-2 and increases up to 5 times with growing post-deformation.

Original languageEnglish
Pages (from-to)129-134
Number of pages6
JournalZeitschrift fur Kristallographie
Volume221
Issue numberSUPPL. 23
Publication statusPublished - Dec 1 2006

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Keywords

  • Dislocation structure
  • Line profile analysis
  • Severe plastic deformation

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Inorganic Chemistry

Cite this

Schafler, E., Nyilas, K., Bernstorff, S., Zeipper, L., Zehetbauer, M., & Ungàr, T. (2006). Microstructure of post-deformed ECAP-Ti investigated by multiple X-ray line profile analysis. Zeitschrift fur Kristallographie, 221(SUPPL. 23), 129-134.