Microstructure of diamond-SiC nanocomposites determined by X-ray line profile analysis

J. Gubicza, T. Ungár, Y. Wang, G. Voronin, C. Pantea, T. W. Zerda

Research output: Contribution to journalArticle

25 Citations (Scopus)


Diamond composites with nanosize diamond crystals and nanosize SiC matrix were obtained at 8 GPa and temperatures varied between 1800 and 2000 °C. Multiple Whole Profile fitting method applied to X-ray diffractograms of sintered composites provided information on crystallite size and population of dislocations. When the temperature was increased at a constant pressure, it led to a growth of crystallite sizes in both phases and reduced population of dislocations. Porosity was limiting hardness of the specimens indicating importance of sample preparation prior to sintering nanosize diamond powders.

Original languageEnglish
Pages (from-to)1452-1456
Number of pages5
JournalDiamond and Related Materials
Issue number9
Publication statusPublished - Sep 1 2006


  • Diamond crystal
  • High pressure high temperature
  • SiC
  • Superhard materials

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Mechanical Engineering
  • Materials Chemistry
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Microstructure of diamond-SiC nanocomposites determined by X-ray line profile analysis'. Together they form a unique fingerprint.

  • Cite this