Microstructure of diamond-SiC nanocomposites determined by X-ray line profile analysis

J. Gubicza; T. Ungár; Y. Wang; G. Voronin; C. Pantea; T. W. Zerda

doi:10.1016/j.diamond.2005.10.064

Microstructure of diamond-SiC nanocomposites determined by X-ray line profile analysis

J. Gubicza, T. Ungár, Y. Wang, G. Voronin, C. Pantea, T. W. Zerda

Eötvös Loránd University

Research output: Contribution to journal › Article

25 Citations (Scopus)

Abstract

Diamond composites with nanosize diamond crystals and nanosize SiC matrix were obtained at 8 GPa and temperatures varied between 1800 and 2000 °C. Multiple Whole Profile fitting method applied to X-ray diffractograms of sintered composites provided information on crystallite size and population of dislocations. When the temperature was increased at a constant pressure, it led to a growth of crystallite sizes in both phases and reduced population of dislocations. Porosity was limiting hardness of the specimens indicating importance of sample preparation prior to sintering nanosize diamond powders.

Original language	English
Pages (from-to)	1452-1456
Number of pages	5
Journal	Diamond and Related Materials
Volume	15
Issue number	9
DOIs	https://doi.org/10.1016/j.diamond.2005.10.064
Publication status	Published - Sep 1 2006

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Keywords

Diamond crystal
High pressure high temperature
SiC
Superhard materials

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Chemistry(all)
Mechanical Engineering
Materials Chemistry
Electrical and Electronic Engineering

Cite this

Gubicza, J., Ungár, T., Wang, Y., Voronin, G., Pantea, C., & Zerda, T. W. (2006). Microstructure of diamond-SiC nanocomposites determined by X-ray line profile analysis. Diamond and Related Materials, 15(9), 1452-1456. https://doi.org/10.1016/j.diamond.2005.10.064

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10.1016/j.diamond.2005.10.064