Microstructure of Bulk Nanomaterials Determined by X-Ray Line-Profile Analysis

T. Ungár, Erhard Schafler, J. Gubicza

Research output: Chapter in Book/Report/Conference proceedingChapter

14 Citations (Scopus)
Original languageEnglish
Title of host publicationBulk Nanostructured Materials
PublisherJohn Wiley and Sons
Pages361-386
Number of pages26
ISBN (Print)9783527315246
DOIs
Publication statusPublished - Jun 24 2009

Fingerprint

Nanostructured materials
Vacancies
X rays
Microstructure

Keywords

  • Bulk nanomaterials
  • Crystallite size in bulk materials
  • Microstructure
  • Subgrains
  • Vacancies
  • X-ray line-profile analysis

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Microstructure of Bulk Nanomaterials Determined by X-Ray Line-Profile Analysis. / Ungár, T.; Schafler, Erhard; Gubicza, J.

Bulk Nanostructured Materials. John Wiley and Sons, 2009. p. 361-386.

Research output: Chapter in Book/Report/Conference proceedingChapter

Ungár, T. ; Schafler, Erhard ; Gubicza, J. / Microstructure of Bulk Nanomaterials Determined by X-Ray Line-Profile Analysis. Bulk Nanostructured Materials. John Wiley and Sons, 2009. pp. 361-386
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